Characterization, substrate morphological

STM is ideally suited to characterize the morphology of nanostructures grown on single-crystal substrates. The self-organization of nanoclusters with a preferential size distribution on semiconductor surfaces is being exploited to form quantum dots, and a huge number of studies in this technologically important field have been conducted. Here, however, we provide two examples that relate to catalysis and electrocatalysis. 

Small amounts of Ru or Ir were sputter-deposited on Pt-NSTF substrate to determine their stability and OER activity in a fuel cell environment. Ex situ characterization of as-grown material was first performed in order to characterize the morphology and surface state of each OER catalyst. Scanning transmission electron microscopy (STEM) and X-ray photoelectron spectroscopy (XPS) were employed to complete this task. Two different OER catalyst loadings were studied, 2 and 10 pg/cm, in order to explore the impact of layer thickness on the catalyst morphology and composition. 

Bar et al. [71] characterized the morphology of blends of poly(styrene)-WocA -poly(ethene-co-but-l-ene)-WocA -poly(styrene) with isotactic and atactic polypropylene block copolymers by ICAFM. Samples deposited from solution onto a glass substrate, dried, and annealed or quenched from the melt and by samples cut by an ultramicrotome were compared with earher TEM results. The polymer film on the side of the film-glass interface was studied rather than the free surfaces of the polymer. 

Other characterization methods are usually used to detect the changes in physical properties, which usually result from the changes in the morphology and structures of the substrates due to grafting. 

A. Collagen substrate, 0% FCS (fetal calf serum) B. Spider silk-ELP substrate, 0% FCS C. No substrate, 0% FCS D No substrate, 10% FCS. In A and C, the cells have an elongated, fibroblastoid morphology, which characterizes dedifferentiation. The spider silk-elastin substrate (B) or the presence of 10% FCS in dishes without a substrate (D) produce a more favorable morphology. 

Substrate Characterization. Venables et al. (2.) have described the FPL oxide morphology using STEM In the SEM mode. Figure 1 Is an Isometric representation of the FPL surface. In contrast, the SAA process produces a much thicker oxide layer, Isometrlcally represented In Fig. 2. 

Surface Morphology. The initial Integrity of an adhesively bonded system depends on the surface oxide porosity and microscopic roughness features resulting from etching or anodization pretreatments. (17) The SAA surface characterized in this study consists of a thick (9 ym), porous columnar layer which provides excellent corrosion resistance in both humid and aggressive (i.e., Cl ) media. I The thinner FPL oxide provides a suitable substrate surface for evaluating the candidate inhibitors. 

---