Beam-surface impact

The apparatus for the PFAM film coating on the slider surface is shown in Fig. 1 (a). The film thickness was measured by the TOF-SIMS as shown in Fig. 1 (b). It used a pulsed primary Ga+ ion beam to impact the surface of the PFAM film with an inset energy of 15 keV, an extractor current of 2 fj,A, beam current of 600 pA, a pulse width of 17.5 ns, and a frequency of 10 kHz, respectively. The positive TOF-SIMS spectra on the slider surface is shown in Fig. 2 where the peaks at m/z 31, 50, 69, 100, and 131 in Fig. 2(a) correspond to the positive secondary ion fragments of CF+, CFj, C2F4, and C3F5, respectively. The peak at m/z 469 apparent in Fig. 2(b) corresponds to the ion C12H7F 15O2H+ which is the characteristic ion of PFAM molecules. Therefore, the positive TOF-SIMS spectra demonstrates the existence of PFAM film [24,25]. The thickness of the PFAM film can be determined... 

Not discussed herein is very recent experimental work in which the thermal distribution of molecules and atoms of a cluster after surface impact has been measured and compared to information theory. There are two reasons why these results should be mentioned. One is that the experiment used a cluster beam incident at an angle (f) with respect to the normal. It measured the component of velocity parallel to the surface. But in the plane containing the incident beam, there are two such components. One at an angle tt — 0 with the cluster beam and one at an angle TT + (j>. The observed velocity distribution in both directions was identical. This is a computation-free proof of the equilibration. The other point is the magnitude of the measured temperature which was of the order of 15 000 °K, same as that measured for electrons boiling out of the impact. ... 

Aside from the freedom to choose the primary ion beam type, impact energy, impact angle, and impact current, there exist nnmerous modes under which these can be operated. For starters, the primary ion beam, or beams, can be directed at the sample s surface over some predefined area ranging from < 1 pm to > 10,000 pm. This can be directed in a stationary mode or the rastered mode. 

ESD Electron-stimulated (impact) desorption [148, 149] An electron beam (100-200) eV) ejects ions from a surface Surface sites and adsorbed species... 

Classical ion trajectory computer simulations based on the BCA are a series of evaluations of two-body collisions. The parameters involved in each collision are tire type of atoms of the projectile and the target atom, the kinetic energy of the projectile and the impact parameter. The general procedure for implementation of such computer simulations is as follows. All of the parameters involved in tlie calculation are defined the surface structure in tenns of the types of the constituent atoms, their positions in the surface and their themial vibration amplitude the projectile in tenns of the type of ion to be used, the incident beam direction and the initial kinetic energy the detector in tenns of the position, size and detection efficiency the type of potential fiinctions for possible collision pairs. 

When an ion beam is incident on an atomically flat surface at grazing angles, each surface atom is shadowed by its neighbouring atom such that only forwardscattering (FS) is possible these are large impact parameter (p) collisions. 

This technique can be applied to samples prepared for study by scanning electron microscopy (SEM). When subject to impact by electrons, atoms emit characteristic X-ray line spectra, which are almost completely independent of the physical or chemical state of the specimen (Reed, 1973). To analyse samples, they are prepared as required for SEM, that is they are mounted on an appropriate holder, sputter coated to provide an electrically conductive surface, generally using gold, and then examined under high vacuum. The electron beam is focussed to impinge upon a selected spot on the surface of the specimen and the resulting X-ray spectrum is analysed. 

Supersonic molecular beam (SMB) mass spectrometry (SMB-MS) measures the mass spectrum of vibra-tionally cold molecules (cold El). Supersonic molecular beams [43] are formed by the co-expansion of an atmospheric pressure helium or hydrogen carrier gas, seeded with heavier sample organic molecules, through a simple pinhole (ca. 100 p,m i.d.) into a 10 5-mbar vacuum with flow-rates of 200 ml. rn in. In SMB, molecular ionisation is obtained either through improved electron impact ionisation, or through hyperthermal surface ionisation... 

Table 7.83 lists the main characteristics of TLC-FAB-MS/LSIMS. A key difference between EI/CI and FAB/LSIMS/LD is the fact that sampling in FAB and LSIMS is from a specified location that corresponds to the impact footprint of the primary particle beam. The natural compatibility of FAB, LSIMS and LD with the direct mass-spectrometric analysis of TLC plates is readily apparent. Most mass-spectrometric measurements are destructive in nature, but FAB and LSIMS are surface-sensitive techniques in which the material actually consumed in the analysis is sputtered only from the top few microns of the sample spot. The underlying bulk is not affected, and can be used for further probing. The major limitation of TLC-FAB depends on the capability of the compounds to produce a good spectrum. 

The impact of an ion beam on the electrode surface can result in the transfer of the kinetic energy of the ions to the surface atoms and their release into the vacuum as a wide range of species—atoms, molecules, ions, atomic aggregates (clusters), and molecular fragments. This is the effect of ion sputtering. The SIMS secondary ion mass spectrometry) method deals with the mass spectrometry of sputtered ions. The SIMS method has high analytical sensitivity and, in contrast to other methods of surface analysis, permits a study of isotopes. In materials science, the SIMS method is the third most often used method of surface analysis (after AES and XPS) it has so far been used only rarely in electrochemistry. 

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