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Resolution atomic force microscopy

The ability to control the position of a fine tip in order to scan surfaces with subatomic resolution has brought scanning probe microscopies to the forefront in surface imaging techniques. We discuss the two primary techniques, scanning tunneling microscopy (STM) and atomic force microscopy (AFM) the interested reader is referred to comprehensive reviews [9, 17, 18]. [Pg.294]

The most popular of the scanning probe tecimiques are STM and atomic force microscopy (AFM). STM and AFM provide images of the outemiost layer of a surface with atomic resolution. STM measures the spatial distribution of the surface electronic density by monitoring the tiumelling of electrons either from the sample to the tip or from the tip to the sample. This provides a map of the density of filled or empty electronic states, respectively. The variations in surface electron density are generally correlated with the atomic positions. [Pg.310]

GiessibI F J 1995 Atomic resolution of the silicon (111 )-(7 7) surface by atomic force microscopy Science 260 67... [Pg.1724]

Shao Z and Yang J 1995 Progress in high-resolution atomic-force microscopy in biology Qt Rev. Biophys. 28 195 Shao Z, Mou J, Cza]kowsky D M, Yang J and Yuan J 1996 Biological atomic force microscopy what is achieved and... [Pg.1727]

Lai R, Kim FI, Garavito R M and Arnsdorf M F 1993 Imaging of reconstituted biological channels at molecular resolution by atomic force microscopy Am. J. Physiol. 265 C851... [Pg.1728]

The very new techniques of scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) have yet to establish themselves in the field of corrosion science. These techniques are capable of revealing surface structure to atomic resolution, and are totally undamaging to the surface. They can be used in principle in any environment in situ, even under polarization within an electrolyte. Their application to date has been chiefly to clean metal surfaces and surfaces carrying single monolayers of adsorbed material, rendering examination of the adsorption of inhibitors possible. They will indubitably find use in passive film analysis. [Pg.34]

Atomic force microscopy (AFM) has become a standard technique for high-resolution imaging of the topography of surfaces. It enables one to see nanoscopic... [Pg.47]

The FFM based on the atomic force microscopy (AFM) is the most available tool to study the feature of microscale friction and wear of material surface with high resolution [6]. So the... [Pg.188]

The combination of atomic force microscopy (AFM) and Raman spectroscopy is another approach to attain high spatial resolution. AFM also employs a sharp tip close to a sample surface. When the tip is made of metal and light is irradiated onto the tip and surface, Raman scattering is largely enhanced. In this way, a spatial resolution of 15 nm is achieved [2]. [Pg.4]

Fukuma, T., Kobayashi, K., Matsushige, K., and Yamada, H. (2005). True molecular resolution in liquid by frequency-modulation atomic force microscopy. Appl. Phys. Lett. 86, 193108. [Pg.238]

High-Resolution scanning electron and atomic force microscopies observation of nanometer features on zeolite Surfaces... [Pg.23]

It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power. [Pg.23]

I believe, it is fair to state that scanning tunneling microscopy and related techniques such as atomic force microscopy have a tremendeous potential in metal deposition studies. The inherent nature of the deposition process which is strongly influenced by the defect structure of the substrate, providing nucleation centers, requires imaging in real space for a detailed picture of the initial stages. This is possible with an STM, the atomic resolution being an extra bonus which helps to understand these processes on... [Pg.146]

Atomic force microscopy (AFM) can be used to obtain high-resolution imagery of molecular orientation and ordering for materials adsorbed onto substrates. Early AFM studies on gluconamides were hampered by the tendency of the fibers to unravel on substrates forming bilayer sheets.41 These layers showed the head-to-tail packing of a monolayer which is similar to the crystal structure reported for anhydrous gluconamides.38 A procedure to retain the fiber networks on surfaces with the addition of a small fraction of... [Pg.291]

Han W, Mou J, Sheng J, Yang J, Shao Z. Cryo atomic force microscopy A new approach for biological imaging at high resolution. Biochemistry 1995 34 8215-8220. [Pg.232]

Shao Z, Yang J. Progress in high resolution atomic force microscopy in biology. Quarterly Rev Biophysics 1995 28 195-251. [Pg.232]

Baldwin PM, Adler J, Davies MC, Melia CD. High resolution imaging of starch granule surfaces by atomic force microscopy. J Cereal Sci 1998 27 255-265. [Pg.232]

Baker AA, Helbert W. Sugiyama J, Miles MJ. High-resolution atomic force microscopy of native Valonia cellulose I. Microcrystals. J Struct Biol 1997 119 129-138. [Pg.233]


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See also in sourсe #XX -- [ Pg.2395 ]




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