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Atomic force modulation

Maivald, P, Butt, H.J., Gould, S.A., Prater, C.B., Drake, B., Gurley, J.A., Elings, VB. and Hansma, P.K.. Using force modulation to image surface elasticities with the atomic force microscope. Nanotechnology, 2, 103-106 (1991). [Pg.217]

Fukuma, T., Kobayashi, K., Matsushige, K., and Yamada, H. (2005). True molecular resolution in liquid by frequency-modulation atomic force microscopy. Appl. Phys. Lett. 86, 193108. [Pg.238]

Tapered module design, 15 835 Tapholes, blast furnace, 14 505-507, 509 Taphonomy, 5 752 Tapioca/cassava starch, 4 724t Tapping mode, in atomic force microscopy, 77 63 Tapping-mode AFM, 24 84 Tapping mode atomic force microscopy (TMAFM), 14 465, 16 501 Taq polymerase, 72 513 Taquidil... [Pg.921]

Fig. 7 (a) Catechol derivatized tetracenes self-assemble on metal oxide surfaces such as aluminum oxide, (b) Schematic and (c) scanning electron micrographs of FET structures fabricated with a 5-nm aluminum oxide layer on top of a 5-nm thermally oxidized Si wafer to allow self-assembly of the derivatized tetracene between sub-100 nm Au source and drain electrodes, (d) /d-Eds characteristics of the assembled tetracene monolayer FET for a 40 nm channel length showing hole modulation and (inset) an atomic force microscope image of the FET channel... [Pg.225]

Atomic Force Microscopy (AFM) This module examines the techniques behind AFM and shows its applications in studying surfaces, particularly silicon surfaces, such as those that might be used in semiconductors and computer chips. [Pg.254]

Giessibl FJ, Tortonese M (1997) Self-oscillating mode for frequency modulation noncontact atomic force microscopy. Appl Phys Lett 70 2529... [Pg.473]

Characterization of the copolymers containing 10 - 30 wt% of silicone macromonomers was done by GPC, DSC, SEM, TEM, surface analysis (SIMS, XPS, contact angle), and especially atomic force microscopy (both Tapping Mode and force modulation mode). [Pg.804]

Figure 5.16 Force modulation. The tip is kept in contact with the sample. Differences in local properties of the sample will be reflected in the amplitude change of the cantilever. (Reproduced with permission from P.C. Braga and D. Ricci (eds), Atomic Force Microscopy, Humana Press. 2004 Humana Press.)... Figure 5.16 Force modulation. The tip is kept in contact with the sample. Differences in local properties of the sample will be reflected in the amplitude change of the cantilever. (Reproduced with permission from P.C. Braga and D. Ricci (eds), Atomic Force Microscopy, Humana Press. 2004 Humana Press.)...
Recent developments combining modulated temperature differential scanning calorimetry with atomic force microscopy have developed a technique called scanning... [Pg.260]

Figure 4.20 Cartoon of atomic force microscope. The sample mount is usually on a piezoeleetrie crystal, which can be moved by a voltage from the data-proeessing module, in response to the signal from the cantilever. Figure 4.20 Cartoon of atomic force microscope. The sample mount is usually on a piezoeleetrie crystal, which can be moved by a voltage from the data-proeessing module, in response to the signal from the cantilever.
The R modules are not carbohydrate-binding modules, but appear to be the opposite. Direct atomic force microscopy (AFM) measurements found that polymannuronan bound more tightly to the AlgE4 A subunit than to the AR holoenzyme," and that the isolated R module did not bind polymannuronate at all. From the various force-extension curves it is possible to calculate the... [Pg.618]


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See also in sourсe #XX -- [ Pg.83 ]




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