High-resolution scanning electron

High-Resolution scanning electron and atomic force microscopies observation of nanometer features on zeolite Surfaces... 

It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power. 

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Blackson, J., Garcia-Meitin, E., and Darus, M., High Resolution Scanning Electron Microscopy Examination of Polymer Morphology, Microscopy and Microanalysis, 13 (Suppl. 02), 1062 (2007)... 

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Fig. 16 High-resolution scanning electron microscope micrographs of Cr-shadowed (a) nascent resin G and (b) compression-sheared TE-30...

Fig. 1. Morphology of nanosilver inks after sintering. High resolution scanning electron micrographs of cross-sections of inkjet printed features after sintering at 150°C for 60 minutes (a) Cima Nanotech ink, (b) Cabot ink.

Centonze, V. E., Chen, Y., Severson, T. J., Borisy, G. G., and Nibert, M. L. (1995). Visualization of single reovirus particles by low-temperature, high-resolution scanning electron microscopy./. Struct. Biol. 115, 215-225. 

The solid state displacement reaction method and wet chemical precipitation method were employed for synthesizing the ceria powders, and thus the ceria properties showed different features in several experiments. Figure 15.10 shows the morphology of the ceria particles observed with high-resolution scanning electron microscopy (SEM S900, Hitachi, Japan) and transmission electron microscopy (TEM JEM-2010, JEOL, Japan). In the figure, the ceria particles have a polyhedral shape. Both of the powders have nearly the same size. The primary particle size is approximately 40 mn. However, the difference in crystal shape of the ceria particles was found on TEM analysis. 

Fig. 6. High-resolution scanning electron micrograph of the pellicle layer formed within 30 min on the enamel surface. 

Use of high-resolution scanning electron microscopy (SEM) allowed the uncovering of a further substructure in these polymer-fullerene blends, besides some larger fullerene clusters (see Fig. 24) MDMO-PPV nanospheres representing a coiled polymer conformation were detected together with some solvent-dependent amount of PCBM fullerenes [55,60-62,137]. 

Si Al ratio of the outer layers (ca. 10 A) of the zeolite crystals. The extent to which the surface composition differs from the bulk composition appears to depend on preparation conditions, and all three possible situations (silicon rich surface, silicon deficient surface and surface composition equal to bulk composition) have been reported (refs. 12-14). Variations in aluminium distribution have also been probed by high resolution scanning electron microscopy (ref. 15) and energy dispersive X-ray analysis (ref. 16). 

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