Atomic force microscopy junction

Atomic force microscopy of palladium nanowires showing the (a) open break junction before exposure to hydrogen and (b) closed break junction after exposure to hydrogen. 

Wold DV, Haag R, Rampi MA, Frisbie CD (2002) Distance dependence of electron tunneling through self-assembled monolayers measured by conducting probe atomic force microscopy unsaturated versus saturated molecular junctions. J Phys Chem B 106 2813-2816... 

D. J. Wold and C. D. Frisbie, Fabrication and characterization of metal-molecule-metal junctions by conducting probe atomic force microscopy, J. Am. Chem. Soc. 123, 5549-5556 (2001). 

Scheme 3.2 (Top and middle) General schematic for the generation of nanoporous PS film. (Bottom) Atomic force microscopy (AFM) phase images of (a) PS375-tR.il]-PE0225 thin film, and (b) nanoporous PS film from oxidation-induced cleavage of the [Ru] junction.

Current-potential and current transient experiments were performed using a EG G PAR 273 potentiostat and Corrware software. Experiments on the Si/Au junctions were performed on a Solartron ECI 1286 and a FRA 1255 the experiments were done in the dark. Scanning electron microscopy was performed on an AMRAY 1860 FE at an acceleration voltage of 5 kV. The samples were flash-coated with carbon before loading into the chamber. Atomic Force Microscopy (AFM) was performed using a Topometrix Discoverer system. 

EngeUces, V.B., Beebe, J.M., and Erisbie, C.D., Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy, J. Phys. Chem. B. 109, 16801-16810, 2005. 

In this section, we present the morphology development of neat elastomeric polypropylene as well as its blend with POE by means of optical microscopy and atomic force microscopy. ePP is essentially atactic polypropylene, which is amorphous in character, but contains some level of isotacticity (26). The incorporation of crystal-lizable iPP blocks provides the physical junctions to these amorphous ePP to possess elastomeric properties like a network in the solid state, but these crystal junctions can be removed upon melting, and thus affords melt processability like thermoplastics. 

B., Yu, G., and Liu, Y.Q. (2012) Multilayer graphene-coated atomic force microscopy tips for molecular junctions. Adv. Mater, 24, 3482- 3485. 

The available methods of production of integrated circuits have essentially reached the physical limit of their capabilities to construct viable semiconductor transistors. Atomic force microscopy is being used to investigate the construction of transistor-like structures based on quantum dots rather than on semiconductor junctions. 

Figure 5.112. Atomic force microscopy image of nano-l/SWCNT sample exhibiting a Y-junction (7) and an X-junction (2) (A). Transmission electron microscopy image of peptide coated SWCNTs exhibiting Y-junction apparently created through peptide-peptide interactions provided complementary evidence that individual peptide-wrapped SWCNTs could be isolated using an amphiphilic a-helical peptide (B). (See color insert.) (From Musselman et al. [506], (2004) American Chemical Society used with permission.)...

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