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A-Particles detection

Power supply. This permits the detection event to trigger the release of a larger, perhaps proportional, amount of energy. In the example of an a particle detected in a semiconductor (Si diode), a voltage is used to sweep out the electrons and holes before they can recombine. [Pg.2261]

Calibration with known size particles (such as polystyrene latex beads) is used to relate the size of the electrical pulse to the size of the particle. So, the particle counter not only detects that a particle has been detected in the fluid but also the size of the particle. The size threshold determines whether the pulse is large enough to be considered a particle detected or if below the threshold then relegated to just background noise. Liquid chemical particle counters are available for the size range of 0.04—20 pm. [Pg.307]

Figure 4.58 Steps for gas concentration measurements inside gas-solids systems via combination of VIS and IR images VIS camera image (A), particle detection from ViS image (B), IR camera image (C), particle removal by stitching VIS-IR image (D), apparent absorbance (E), and concentration profile (F). Reprinted from Dang etal. (2013) with permission from Eisevier. Figure 4.58 Steps for gas concentration measurements inside gas-solids systems via combination of VIS and IR images VIS camera image (A), particle detection from ViS image (B), IR camera image (C), particle removal by stitching VIS-IR image (D), apparent absorbance (E), and concentration profile (F). Reprinted from Dang etal. (2013) with permission from Eisevier.
AIDA-II was successfully applied for the chemical experiments with Db [93], The effluent is collected as Fraction 1 on a 15 x 300 mm tantalum sheet (0.15-mm thickness) which was continuously moving toward an a-particle detection chamber at 2.0 cm s . The sample on the sheet is automatically evaporated to dryness with a halogen heat lamp and then subjected to the a-particle measurement in the chamber equipped with an array of 12 silicon PIN photodiode detectors [93]. Remaining products on the resin were eluted with a strip solution. The eluate is collected on another Ta sheet as Fraction 2 followed by the same procedures for sample preparation and measurement. The a-particle measurement was started 14 and 38 s after the end of product collection for Fractions 1 and 2, respectively. The result is also presented in Liquid-Phase Chemistry of Superheavy Elements . [Pg.282]

The PLM can be used in a reflection or a transmission mode. With either mode, light of various wavelengths from ultraviolet to infrared, polarized or unpolarized, is used to yield a wide variety of physical measurements. With just ordinary white light, a particle or any object detail down to about 0.5 p.m (500 nm) in diameter can be observed to detect shape, size, color, refractive index, melting point, and solubiUty in a group of solvents, all nondestmetively. Somewhat larger particles yield UV, visible, or IR absorption spectra. [Pg.333]

A large number of radiometric techniques have been developed for Pu analysis on tracer, biochemical, and environmental samples (119,120). In general the a-particles of most Pu isotopes are detected by gas-proportional, surface-barrier, or scintillation detectors. When the level of Pu is lower than 10 g/g sample, radiometric techniques must be enhanced by preliminary extraction of the Pu to concentrate the Pu and separate it from other radioisotopes (121,122). Alternatively, fission—fragment track detection can detect Pu at a level of 10 g/g sample or better (123). Chemical concentration of Pu from urine, neutron irradiation in a research reactor, followed by fission track detection, can achieve a sensitivity for Pu of better than 1 mBq/L (4 X 10 g/g sample) (124). [Pg.200]

The high cross-section for thermal neutrons results in the use of boron and boron compounds for radiation shielding (14). The ease of detecting the a-particle produced when boron absorbs thermal neutrons results in the use of boron for neutron counters as weU. [Pg.184]

It is imphcit that increasing the value of Ly will raise the supersaturation and growth rate to levels at which mass homogeneous nucleation can occur, thereby leading to periodic upsets of the system or cycling [Randolph, Beer, and Keener, Am. In.st. Chem. Eng. J., 19, 1140 (1973)]. That this could actually happen was demonstrated experimentally by Randolph, Beckman, and Kraljevich [Am. In.st. Chem. Eng. J., 23, 500 (1977)], and that it could be controlled dynamically by regulating the fines-destruction system was shown by Beckman and Randolph [ibid., (1977)]. Dynamic control of a ciystaUizer with a fines-destruction baffle and fine-particle-detection equipment... [Pg.1662]

It is applicable to plastic packaging materials, where purities with respect to mobile ions, such as Cl and Na, can be checked. In addition, a-particle precursors, such as U and Th, can be determined in solid plastics with sub-ppb detection limits. [Pg.672]

A beam of charged particles (an ion beam) with an energy from a few hundred keV to several MeV is produced in an accelerator and bombards a sample. Nuclear reactions with low-Z nuclei in the sample are induced by this ion beam. Products of these reactions (typically p, d, t, He, a particles, and y rays) are detected, producing a spectrum of particle yield versus energy. Many (p, a) reactions have energies that are too low for efficient detection. In these cases, the associated y rays are detected instead. Important examples are ... [Pg.681]

In nonresonant profiling, the silicon surface barrier detectors that detect the products of the nuclear reaction may also detect signals from incident ions that have been backscattered from the sample. Figure 4 shows an a particle spectrum from the reaction (p, a) along with the signal produced by backscattered... [Pg.686]

As earlier discussed, the dominant factor in the near-surface region is the particle detection system. For a typical silicon surface barrier detector (15-keV FWHM resolution for Fle ions), this translates to a few hundred A for protons and 100— 150 A for Fle in most targets. When y rays induced by incident heavy ions are the detected species (as in FI profiling), resolutions in the near-surface region may be on order of tens of A. The exact value for depth resolution in a particular material depends on the rate of energy loss of incident ions in that material and therefore upon its composition and density. [Pg.688]

LC-MS with on-line SPE using a RAM pre-column with an internal ODS phase was described by van der Hoeven et al. (95) for the analysis of cortisol and prednisolone in plasma, and arachidonic acid in urine. The samples were injected directly and the only off-line pretreatment required was centrifugation. By using the on-line SPE-LC-MS system, cortisol and related compounds could be totally recovered and quantified in 100 p.1 plasma within 5 min with a typical detection of 2 ng/ml (Figure 11.6(b)). The RAM-type of sorbents, in which the outer surface of the particles is covered with aj-acid glycoprotein, also appear to be useful for direct SPE of... [Pg.268]

Optically detected magnetic resonance (ODMR) has yielded valuable information about dynamics of long-lived pholoexcitations of conjugated polymers. The technique relies upon the paramagnetic interaction of excitations with an applied magnetic field. For a particle with non-zero spin, placed in a magnetic field, the Hamiltonian is ... [Pg.424]

A particle size effect has been detected by Chou and Olson [486] in the isothermal decomposition of isothiocyanatopentammine cobalt(III) perchlorate. Below a = 0.09, the larger crystals decompose relatively more rapidly than the smaller, whereas for a > 0.09, the reverse is true. This behaviour was attributed to enhanced nucleation in the larger particles due to strain, but this favourable factor was later offset by the inhibiting influence of the product ammonia which accumulated in the larger crystals. [Pg.74]

Fig. 3—Measurement of surface by HDI surface reflectance analyzer. In electromagnetic radiation (light), the polarization direction is defined as the direction of the electric field vector. The incident polarization of the light can be controlled. The instrument uses a variety of detectors to analyze the reflected polarization state of the light. (U.S. Patent 6,134,011). (a) Plane of the disk The SRA uses a fixed 60 degree (from the surface normal) angle of incidence. The plane of incidence is the same as the paper plane (b) Pit on a surface detected by reflected light channels of HDI instrument (c) Scratches on disk surface measured by HDI surface reflectance analyzer (d) Particles on the surface of disk detected by reflected light (black spot) and by scattered light (white spot) [8]. Fig. 3—Measurement of surface by HDI surface reflectance analyzer. In electromagnetic radiation (light), the polarization direction is defined as the direction of the electric field vector. The incident polarization of the light can be controlled. The instrument uses a variety of detectors to analyze the reflected polarization state of the light. (U.S. Patent 6,134,011). (a) Plane of the disk The SRA uses a fixed 60 degree (from the surface normal) angle of incidence. The plane of incidence is the same as the paper plane (b) Pit on a surface detected by reflected light channels of HDI instrument (c) Scratches on disk surface measured by HDI surface reflectance analyzer (d) Particles on the surface of disk detected by reflected light (black spot) and by scattered light (white spot) [8].
If a liquid contairring particulate matter, blood cells, bacteria or srrspensions of inarrimate matter is passed down the tube, when a particle passes through the orifice a change in resistance in the circuit occurs and the change m be recorded by the usual detection or print-out devices. Both the number of particles per unit of time and then-size m be determined. [Pg.23]

In terms of the accuracy of measurement, it appears from Tables III - V that detection of a narrow distribution particle mixture at 350 or 280 nm is just as advantageous as detection at 25U nm. However for a broad particle size distribution sample, detection at 25U nm or lower where particles absorb, provides a distinct improvement in small particle detection (T.) ... [Pg.70]


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See also in sourсe #XX -- [ Pg.4 , Pg.52 ]




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