Transmission electron microscopy spectroscopy

Occasionally, especially in the developmental phase of catalyst research, it is necessary to determine the oxidation state, exact location, and dispersion of various elements in the catalyst. Eor these studies, either transmission electron microscopy (TEM) or scanning electron microscopy (SEM) combined with various high vacuum x-ray, electron, and ion spectroscopies are used routinely. 

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. 

Four different material probes were used to characterize the shock-treated and shock-synthesized products. Of these, magnetization provided the most sensitive measure of yield, while x-ray diffraction provided the most explicit structural data. Mossbauer spectroscopy provided direct critical atomic level data, whereas transmission electron microscopy provided key information on shock-modified, but unreacted reactant mixtures. The results of determinations of product yield and identification of product are summarized in Fig. 8.2. What is shown in the figure is the location of pressure, mean-bulk temperature locations at which synthesis experiments were carried out. Beside each point are the measures of product yield as determined from the three probes. The yields vary from 1% to 75 % depending on the shock conditions. From a structural point of view a surprising result is that the product composition is apparently not changed with various shock conditions. The same product is apparently obtained under all conditions only the yield is changed. 

Several structural characterisations of carbon nanotubes (CNTs) with the cylindrical graphite are reviewed from the viewpoint of transmission electron microscopy (TEM). Especially, electron energy loss spectroscopy (EELS) by using an energy-fdtered TEM is applied to reveal the dependence of fine structure of EELS on the diameter and the anisotropic features of CNTs. 

SAXS), IR spectroscopy, NMR, transmission electron microscopy (TEM), or atomic force microscopy (AFM) and the thermal transitions by DSC and DMA. 

Transmission electron microscopy (TEM) The dispersion of cobalt oxide species on the titania supports were determined using a JEOL-TEM 200CX transmission electron spectroscopy operated at 100 kV with 100k magnification. 

Fig. 4 Osmium clusters supported on MgO(OOl) a OssC/MgisOs and b OS5C at a surface point Vs defect site [33] these were represented by density functional theory, and the samples were characterized by EXAFS spectroscopy, transmission electron microscopy, and other techniques [15]...

Usually bimetallic nanoparticles as well as monometallic ones are characterized by many probing tools such as UV-visible (UV-Vis) spectroscopy, transmission electron microscopy (TEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), EXAFS, infrared spectroscopy of adsorbed CO (CO-IR), and so on [1,2]. 

Transition metal oxides, rare earth oxides and various metal complexes deposited on their surface are typical phases of DeNO catalysts that lead to redox properties. For each of these phases, complementary tools exist for a proper characterization of the metal coordination number, oxidation state or nuclearity. Among all the techniques such as EPR [80], UV-vis [81] and IR, Raman, transmission electron microscopy (TEM), X-ray absorption spectroscopy (XAS) and NMR, recently reviewed [82] for their application in the study of supported molecular metal complexes, Raman and IR spectroscopies are the only ones we will focus on. The major advantages offered by these spectroscopic techniques are that (1) they can detect XRD inactive amorphous surface metal oxide phases as well as crystalline nanophases and (2) they are able to collect information under various environmental conditions [83], We will describe their contributions to the study of both the support (oxide) and the deposited phase (metal complex). 

There is great interest in developing molecular precursors for boron-nitrogen polymers and boron nitride solid state materials, and one general procedure is described in this report. Combinations of B-trichloroborazene and hexamethyldisilazane lead to formation of a gel which, upon thermolysis, gives hexagonal boron nitride. The BN has been characterized by infrared spectroscopy, x-ray powder diffraction and transmission electron microscopy. 

The boron nitride obtained in this study was characterized by infrared spectroscopy, powder x-ray diffractometry and transmission electron microscopy. Trace elemental analyses were also performed by energy dispersive x-ray analysis and carbon arc emission spectroscopy. Representative spectra are displayed in Figures 2-4. 

In one other example, Raman spectroscopy was employed along with FTIR spectroscopy, XPS, elemental analysis, TGA, SEM and transmission electron microscopy (TEM) to follow the compositional and structure variations of polymethylsilsesquioxane samples pyrolysed at different temperatures in an atmosphere of nitrogen [56]. At 900°C the main product was silica, with formation too of some silica oxycarbide and amorphous carbon, with Raman spectroscopy showing complementary evidence for presence of both the minor species. 

SEM and transmission electron microscopy (TEM) are employed to examine materials for the presence and distribution of impact modifiers such as polybutadiene rubber in high impact polystyrene (HIPS) and methacrylate butadiene styrene terpolymer in PVC. Quantification is either by transmission IR spectroscopy against standards or nuclear magnetic resonance (NMR) spectroscopy. 

The authors thank A. Appelbaum for Auger analyses, J. M. Gibson for transmission electron microscopy, S. B. Dicenzo for X-ray photoelectron spectroscopy and G. K. Celler and L. E. Trimble for use of their laser. 

---