Thin Films and Interfaces

The nature of the interface formed between very thin metallic films and substrates of various types has been studied extensively by AES, just as it has by XPS 

Other interesting thin-film studies using AES have included the growth of platinum on Ti02- and SrO-terminated (100) SrTiOs single-crystal substrates [2.154], of epitaxial niobium films on (110) T1O2 [2.155], the interaction of copper with a (0001) rhenium surface [2.156], and the characterization of radio-frequency (rf) sputtered TiN films on stainless steel [2.157]. 

A multilayer-type structure probably due to cords in the molten zone between single arc sprayed (0.25 MPa) Ni droplets and steel substrate were found in AES point depth profiles [2.158]. That particular arc spraying condition turned out to yield the best adhesion. Plasma-sprayed AI2O3 layers separated from pre-oxidized Ni Substrate had a micrometer-thick NiO layer on the substrate-sided face and micrometer-deep oxide interdiffusion [2.159]. In this work also, AES point depth profiling substantiated technological assumptions about adhesion mechanisms. 

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Knoll W (1991) Polymer thin films and interfaces characterized with evanescent light. Makromol Chem 192 2827-2856... 

Schultz, P.J. and Lynn, K.G. (1988). Interaction of positron beams with surfaces, thin films and interfaces. Rev. Mod. Phys. 60 701-779. 

ROBERT HWANG is the former director of the Center for Functional Nanomaterials at Brookhaven National Laboratory (BNL). He has recently returned to Sandia National Laboratories. Prior to his arrival at BNL, he managed the Thin Film and Interface Science Department at Sandia National Laboratories. He is currently a member of the Board on Chemical Sciences and Technology. Dr. Hwang received his B.S. from the University of California at Los Angeles and his Ph.D. from the University of Maryland. 

Interaction of Acoustic Waves with Thin Films and Interfaces, Far. Disc. 107 (1997). 

Depth Profiles of Thin Films and Interfaces by the Elastic Recoil Detection Technique... 

Rothenhausler, B., and Knoll, W. Surface-plasmon Microscopy. Nature 322, 615 (1988). Knoll, W. Polymer Thin Films and Interfaces Characterized with Evanescent Light. Makromol. Chem. 192, 2827 (1991). 

Characterization of Materials, Thin Films, and Interfaces by Optical Reflectance and Ellipsometric Techniques... 

Cavendish Laboratory, Thin Films and Interfaces Group - BSS Physics, JJ Thomson Avenue, Cambridge CB3 OHE, UK... 

Tunable VUV and soft X-rays from synchrotron light sources are ideally suited to study surface, near surface (thin film) and interface phenomena. These photons can access many useful core levels of many elements (site specific), they usually do not penetrate very deep and they produce electrons with very short escape depths (surface sensitivity). On the other hand, hard X-rays with great penetration power are ideally suited for all kinds of imaging, such as tomography of rocks and soils. 

This thesis is the result of work carried out between May 2009 and August 2012 with the Thin Films and Interfaces Group at the Cavendish Laboratory, Cambridge, UK, and was only made possible by generous funding through Nokia and with the kind help and support I received from numerous people. 

All sensing techniques demonstrate specific strengths, yet sometimes overlapping, areas of application. In this case, both electrochemical and optical techniques, can allow analysis in real-time, in situ, non-destructive, label-free, thin films and interfaces analysis [33-35],... 

In addition to this chapter and Chapter 13, reflection-related measurements are described in Chapter 9 (external reflection measurements for thin films and interfaces). Chapter 10 (reflection-absorption measurements for thin films on metal substrates), and Chapter 12 (diffuse reflection measurements). 

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