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The Optical System

The excitation source is typically a solid state laser, most frequently a Nd-YAG source, able to deliver high energy pulses ( 100 mJ) with full width at half maximum (FWHM) 20 ns at 1,064, 532, 355 and 266 nm, with repetition rate [Pg.190]


When used for superresolution, the laser beam is incident on b, which hides the domains in s. During read-out, b is heated and the domains in s are copied to b. The optical system sees only the overlap area between the laser spot and the temperature profile which is lagging behind, so that the effective resolution is increased. Experimentally it is possible to double the linear read-out resolution, so that a four times higher area density of the domains can be achieved when the higher resolution is also exploited across the tracks. At a domain distance of 0.6 pm, corresponding to twice the optical cutoff frequency, a SNR of 42 dB has been reached (82). [Pg.148]

Raman spectroscopy of graphite can be an experimental challenge, because the material is a strong blackbody absorber. Generally, low (1—10-mW) laser power is used to minimise heating, which causes the band positions to change. In addition, the expansion of the graphite causes the material to go out of the focus of the optical system, an effect which can be more pronounced in microprobe work. [Pg.213]

When a test result for a particular specimen is found to have an elevated, out of method range value, some analy2ers, eg, Beckman CX3, can automatically repeat the sampling from the same specimen. For elevated concentrations, the precision of the optical system is reduced so an automatic dilution of the sample, eg, by aspiration of a reduced amount of sample, is provided during the second sampling. [Pg.396]

Collecting optics, radiation detectors and some form of indicator are the basic elements of an industrial infrared instrument. The optical system collects radiant energy and focuses it upon a detector, which converts it into an electrical signal. The instrument s electronics amplifies the output signal and process it into a form which can be displayed. There are three general types of instruments that can be used for predictive maintenance infrared thermometers or spot radiometers line scanners and imaging systems. [Pg.799]

A primary concern of the analytical chemist is the range of elements over which a given detector is useful. Unfortunately, such a range cannot be rigidK specified not only does it depend upon the characteristics of the detector and the rest of the optical system but it is determined also by the concentration of the element in a sample, by the composition of the rest of the sample (the matrix ), and by the precision desired. Nevertheless, the usefulness of detectors is so important that an operational comparison is worth while even if it is hedged about with restrictions that limit its applicability. Such a comparison has been carried out41 on eight representative elements with four detectors. [Pg.65]

Figure 9. The entrance and exit pupils are the surfaces where the entrance and exit rays coming from the different field positions cross each other. In different terms, the entrance pupil is the aperture of the optical system as seen by an observer located at the position of the object, or at the location of the image for the exit one. Figure 9. The entrance and exit pupils are the surfaces where the entrance and exit rays coming from the different field positions cross each other. In different terms, the entrance pupil is the aperture of the optical system as seen by an observer located at the position of the object, or at the location of the image for the exit one.
Entrance and exit pupils are conjugates i.e. images of each other through the optical system. The real physical aperture may be neither of them, hut set hy a physical diaphragm or component contour, located... [Pg.26]

The previous section used a mathematical construct called a ray to predict behavior of light in an optical system. We should emphasize that rays are purely a mathematical construct, not a physical reality. Rays work well to describe the behavior of light in cases where we can ignore its wave-like behavior. These situations are ones in which the angular size of the point-spread-function is much greater than A/d, where A is the wavelength of light and d is the diameter of the optical system. [Pg.40]

The most widely used technique in SFA for determining the distance or gap between the sample surfaces is based on the theory of multi-beam interference. A diagram of the optical system for the gap measurement is schematically shown in Fig. 15. [Pg.15]

Fig. 15—A schematic diagram of the optical system based on FECO technique for the gap measurement. Fig. 15—A schematic diagram of the optical system based on FECO technique for the gap measurement.
The sensor chip is held in contact with the prism of the optical system by a microfluidic cartridge that controls the delivery of sample plugs into a tran ort buffer that passes continuously over the sensor chip surfiice. [Pg.777]

After these measures have been taken, the remaining dominant sources of error are in the optical system and electronics, and the effects of Coriolis force, each... [Pg.168]

Figure 5.15. The optical system for a transmission projection microscope. Figure 5.15. The optical system for a transmission projection microscope.
The design and placement of the second beam intensity monitor demands more attention. The definition of X-ray absorption does not discriminate between primary beam, USAXS and SAXS. So the second beam intensity monitor should guide primary beam, USAXS and SAXS through its volume, whereas the WAXS should pass outside the monitor. The optimum setup for SAXS and USAXS measurements is a narrow ionization chamber directly behind the sample. For WAXS measurement a pin-diode in the beam stop is a good solution for WAXS. For USAXS and SAXS it may be acceptable, as long as the relevant part of the primary beam is caught, the optical system is in thermal equilibrium and the synchrotron beam does not jump (cf. Sect. 4.2.3.5). [Pg.77]

Measuring FRET by fluorescence lifetime imaging microscopy (FRET-FLIM) offers the ability to see beyond the resolution of the optical system ( 10-100 times that of modern far field microscopes [5]). FRET efficiency can be used as a proxy for molecular distance, thereby allowing the easy detection and somewhat more challenging quantification of molecular interactions. Although many types of assay exist, FRET-FLIM is a highly suitable technique that is capable of in situ measurements of molecular interactions and conformation in living and fixed cells. [Pg.459]

Figure 53-31b Once the optical beam is completely blocked, no less light can pass through the optical system. The average light that then can pass is the integral of the shaded area. Figure 53-31b Once the optical beam is completely blocked, no less light can pass through the optical system. The average light that then can pass is the integral of the shaded area.
In conventional chip experiments, fluorescence scanners are used for chip read-out. In the case of laser scanners, HeNe lasers are used as excitation sources and photomultiplier tubes as detectors, whereas CCD-based scanners use white light sources. The optical system can be confocal or non-confocal. Standard biochip experiments are performed using two fluorescent labels as... [Pg.492]

The analytical detectability applying a CL method should, in principle, be comparable to that obtained using radioactive labels, without all the disadvantages related to the use of isotopic labeling. In fact, assuming reasonable values for the quantum efficiency of the chemiluminescent reaction (Cl 0.01), for the overall photon collection efficiency of the optical system-CCD camera assembly (T) 0.01%), and for the intensity of the lowest detectable CL signal (about... [Pg.481]


See other pages where The Optical System is mentioned: [Pg.1657]    [Pg.1667]    [Pg.2861]    [Pg.635]    [Pg.114]    [Pg.291]    [Pg.130]    [Pg.427]    [Pg.512]    [Pg.701]    [Pg.237]    [Pg.245]    [Pg.758]    [Pg.760]    [Pg.761]    [Pg.770]    [Pg.777]    [Pg.799]    [Pg.111]    [Pg.202]    [Pg.214]    [Pg.26]    [Pg.286]    [Pg.168]    [Pg.293]    [Pg.64]    [Pg.295]    [Pg.224]    [Pg.107]    [Pg.43]    [Pg.434]    [Pg.477]    [Pg.5]   


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The optical inspection system

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