Surface compositional profile

The data of Zink et al. (1998) illustrate the measurement by NRA of near-surface composition profiles in isotopically labelled polymer blends. If a mixture of polymers is adjacent to a phase interface (e.g. a solid or an air surface), often one of the components is preferentially attracted to the surface and will segregate to it, and this phenomenon will influence the tribological behaviour the interface (lubrication, wear and adhesion). 

The surface compositional profile of Figure 6 confirms this interpretation. Sodium, calcium, and barium are depleted from the enamel surface to a depth of 0.4yU.m. Even zirconium is lost from the surface layer. The Si02 network shows little change with milling which indicates that the surface has developed a predominately Si02-rich film during corrosion. 

Various surface analysis techniques show that silicate glasses rapidly develop surface compositional profiles when exposed to water. When water is present as a vapor an alkali-rich layer (presumably a hydrated alkali carbonate) forms over the SiOj-rich layer. Water as a liquid dissolves the alkali and leaves the silica-rich film. As long as this SiC -rich film is stable the rate of corrosion due to diffusion is reduced with exposure time. Addition of multi-valent species to the glass or reactant results in formation of a complex protective surface layer in the glass which may be stable over a wide range of environmental conditions. 

Cowie, J.M.G., Devlin, B.G., McEwen, I.J. Surface enrichment in polystyrene/poly(vinyl methyl ether) blends. 3. An analysis of the near-surface composition profile. Macromolecules 26, 5628-5632 (1993)... 

AES Auger electron spectroscopy After the ejection of an electron by absorption of a photon, an atom stays behind as an unstable Ion, which relaxes by filling the hole with an electron from a higher shell. The energy released by this transition Is taken up by another electron, the Auger electron, which leaves the sample with an element-specific kinetic energy. Surface composition, depth profiles... 

SIMS Secondary Ion mass spectroscopy A beam of low-energy Ions Impinges on a surface, penetrates the sample and loses energy In a series of Inelastic collisions with the target atoms leading to emission of secondary Ions. Surface composition, reaction mechanism, depth profiles... 

ATR infrared spectroscopy can be used to construct a depth profile showing the way in which the surface composition of a polymer changes as a function of distance away from the surface and into the polymer [3], As long as the polymer is not a very strong absorber, the absorbance of an infrared band in ATR is ... 

This area of research is still at its beginning and many aspects are not resolved. This includes in particular the structure and conformation of polymers at an interface as well as the modification of polymer dynamics by the interface. We have given several examples of the potential of surface and interface analytical techniques. They provide information on surface roughness, surface composition, lateral structure, depth profiles, surface-induced order and interfacial mixing of polymers on a molecular and sometimes subnanometer scale. They thus offer a large variety of possible surface and interface studies which will help in the understanding of polymer structure and dynamics as it is modified by the influence... 

Surface composition and morphology of copolymeric systems and blends are usually studied by contact angle (wettability) and surface tension measurements and more recently by x-ray photoelectron spectroscopy (XPS or ESCA). Other techniques that are also used include surface sensitive FT-IR (e.g., Attenuated Total Reflectance, ATR, and Diffuse Reflectance, DR) and EDAX. Due to the nature of each of these techniques, they provide information on varying surface thicknesses, ranging from 5 to 50 A (contact angle and ESCA) to 20,000-30,000 A (ATR-IR and EDAX). Therefore, they can be used together to complement each other in studying the depth profiles of polymer surfaces. 

TOF-SIMS can be applied to identify a variety of molecular fragments, originating from various molecular surface contaminations. It also can be used to determine metal trace concentrations at the surface. The use of an additional high current sputter ion source allows the fast erosion of the sample. By continuously probing the surface composition at the actual crater bottom by the analytical primary ion beam, multi element depth profiles in well defined surface areas can be determined. TOF-SIMS has become an indispensable analytical technique in modem microelectronics, in particular for elemental and molecular surface mapping and for multielement shallow depth profiling. 

Analysis by the Detection of Scattered Ions. Ions generally penetrate the specimen much less deeply than electrons of equivalent energy, so they are more surface-sensitive. Ion-based surface analytical techniques are popular because of their sensitivity and their ability, in some cases, to reveal the depth composition profile. 

Surface Composition and Depth Profiling of Ruthenium-Iridium Based... 

Recently, such a temperature oscillation was also observed by Zhang et al (27,28) with nickel foils. Furthermore, Basile et al (29) used IR thermography to monitor the surface temperature of the nickel foil during the methane partial oxidation reaction by following its changes with the residence time and reactant concentration. Their results demonstrate that the surface temperature profile was strongly dependent on the catalyst composition and the tendency of nickel to be oxidized. Simulations of the kinetics (30) indicated that the effective thermal conductivity of the catalyst bed influences the hot-spot temperature. 

The elemental composition, oxidation state, and coordination environment of species on surfaces can be determined by X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) techniques. Both techniques have a penetration depth of 5-20 atomic layers. Especially XPS is commonly used in characterization of electrocatalysts. One common example is the identification and quantification of surface functional groups such as nitrogen species found on carbon-based catalysts.26-29 Secondary Ion Mass spectrometry (SIMS) and Ion Scattering Spectroscopy are alternatives which are more surface sensitive. They can provide information about the surface composition as well as the chemical bonding information from molecular clusters and have been used in characterization of cathode electrodes.30,31 They can also be used for depth profiling purposes. The quantification of the information, however, is rather difficult.32... 

SURFACE COMPOSITION AND DEPTH PROFILE OF DEALUMINATED ZEOLITES (43,44)... 

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