SEM image

Boyde A 1970 Practicai probiems and methods in the three-dimensionai anaiysis of SEM images Scanning Electron Microsc. 105 112... 

Figure C2.6.1. SEM image of silica spheres of radius a = 15 nm and polydispersity a < 0.01 (courtesy of Professor A van Blaaderen)...

Because X-ray counting rates are relatively low, it typically requires 100 seconds or more to accumulate adequate counting statistics for a quantitative analysis. As a result, the usual strategy in applying electron probe microanalysis is to make quantitative measurements at a limited collection of points. Specific analysis locations are selected with the aid of a rapid imaging technique, such as an SEM image prepared with backscattered electrons, which are sensitive to compositional variations, or with the associated optical microscope. 

The crater surfaces obtained in the LA-TOF-MS experiment on the TiN-TiAlN-Fe sample were remarkably smooth and clearly demonstrated the Gaussian intensity distribution of the laser beam. Fig. 4.45 shows an SEM image of the crater after 100 laser pulses (fluence 0.35 J cm ). The crater is symmetrical and bell-shaped. There is no significant distortion of the single layers. Fig. 4.45 is an excellent demonstration of the potential of femtosecond laser ablation, if the laser beam had a flat-top, rather than Gaussian, intensity profile. 

Fig. 2. SEM image of the surface of Fe-graphite after pretreatment before catalysis.

Acknowledgement—This research is partially supported by the NSF (ASC-9217368) and by the Materials and Molecular Simulation Center. We thank J. Vazquez for help with the SEM imaging of nanotubes, G. Gorman and R. Savoy for X-ray analysis, and M. 3. dc Vries for mass spectrometry. 

Fig. 5. Scanning electron microscope (SEM) images of aligned MWCNT of uniform length (40 pm) and diameters (30-50 nm). Scales bars are 10 pm (top) and 1 pm (bottom) (Courtesy of Drs. M. Terrones and D. R. M. Walton).

Fig. 2. (a) (b) Transmission electron microscopy (TEM) images of as-grown VGCFs (broken portion) with the PCNT core exposed field emission-type scanning electron microscopy (FE-SEM) image of (c) as-grown and (d) heat-treated VGCFs (broken portion) at 2800°C with PCNT (white line) exposed [20],... 

Fig. 4. Scanning electron microscope (SEM) image of FeCl3-intercalated CNTs assuming a bead-string structure with partially intercalated and swelled portions.

Figure 8 shows the SEM images with a low level of strain (50%). It is clear that even with a low-strain level defects are initiated in the sulfur cured system with the formation of large cracks at the boundary layer between the two phases. However, in the peroxide cured system the mechanism of crack initiation is very different. In the latter case the NR-LDPE interface is not the site for crack initiation. In this case, stress due to externally applied strains is distributed throughout the matrix by formation of fine crazes. Furthermore, such crazes are developed in the continuous rubber matrix in a direction... 

Figure 8 SEM images of etched surfaces of blends with 50% stretching (a) sulfur cured (3000 x) and (b) peroxide cured (3000 X). Source Ref. 27.

Catalyst films for electrochemical promotion studies should be thin and porous enough so that the catalytic reaction under study is not subject to internal mass-transfer limitations within the desired operating temperature. Thickness below 10 pm and porosity larger than 30% are usually sufficient to ensure the absence of internal mass-transfer limitations. Several SEM images of such catalyst films have been presented in this book. SEM characterization is very important in assessing the morphological suitability of catalyst films for electrochemical promotion studies and in optimizing the calcination procedure. 

Fig. 12. SEM images of 5-ASA-loaded spray-dried xylan and ESIOO microparticles in different polymer weight ratios (Unpublished data).

Fig. 14. SEM images of cuprous oxide nanostructures (A) 100 x, (B) 1,000 x, and (C) Schematic illustration of the dendrite structure formation process.

Fig. 33 —SEM images of Si02 particles (a) average Si02 particle size is 15 nm, (b) average Si02 particle size is 30 nm, (c) average SiOj particle size is 50 nm, (d) average SiOj particle size is 160 nm.

Fig. 48—AFM and SEM images of the surfaces polished in two conditions (a) polished in the Type III slurry with powder of 250 nm in diameter, (b) polished in UFD slurry (Type I), (c) polished in the Type III slurry with powder of 250 nm in diameter, (d) polished by UFD slurry (Type I), (e) polished in the Type III slurry with powder of 250 nm in diameter (40,000x), (f) polished by UFD slurry (40,000x).

FIGURE 3.4 Scanning electron microscopic (SEM) images of acrylic copolymer-silica hybrid nanocomposites synthesized from (a) 10 wt% and (b) 50 wt% tetraethoxysilane (TEOS) concentrations. The first number in the legend indicates the wt% of ethyl acrylate (EA) (85) in the ethyl acrylate-butyl acrylate (EA-BA) copolymer, N stands for nanocomposite, and the last number (10, 50) is indicative of the tetraethoxysilane (TEOS) concentration. (From Patel, S., Bandyopadhyay, A., Vijayabaskar, V., and Bhowmick, A.K., J. Mater. Sci., 41, 926, 2006. Courtesy of Springer.)... 

FIGURE 3.16 Morphology and visual appearance of acrylic rubber (ACM)-silica and epoxidized natural rubber (ENR)-silica hybrid composites prepared from different pH ranges (a) transmission electron microscopic (TEM) picture of ACM-siUca in pH 1.0-2.0, (b) scanning electron microscopic (SEM) picture of ACM-siUca in pH 5.0-6.0, (c) SEM image of ACM-siUca in pH 9.0-10.0, (d) TEM picture of ENR-silica in pH... 

Figure 11.20 shows the SEM image of the morphology of 30/70 nylon-EPR blends at two different compatibilizer concentrations. It is apparent that the addition of compatibilizer significantly reduces the size of the dispersed phase. The addition of 10% compatibilizer is sufficient to... 

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