Secondary electron microscope accelerating voltage

A Philips Environmental-SEM/EDX (Phihps XL30) was used to measure the morphology on untreated and plasma-treated powders. The powders were fixed on the sample holder by double conductive adhesive aluminum tape, and then gold-coated. Secondary electron images were recorded with the scanning electron microscope (SEM) using a 15 keV acceleration voltage. 

The image is formed by the signal of emitted secondary electrons, backscattered electrons. Auger electrons, absorbed specimen current (SC), or X-ray quanta, which modulate the intensity of a cathode-ray tube rastered in synchronism (Fig. 75). Conventional SEMs work with electron acceleration voltages of 5 - 30 kV, whereas a low-voltage scanning electron microscope (LVSEM) [222], [223] uses 0.5-5 kV. 

Samples were investigated using a scanning electron microscope (FEI QUANTA 200 ESEM). Air dried samples were fixed onto aluminum stubs through carbon adhesive disks and their fractured surface was observed with a low-vacuum secondary electron detector using the accelerating voltage of 25.0 kV. The samples were analyzed at room temperature and at an internal pressure of 0.50 torr. 

Scanning electron microscopy (SEM) images were captured on a Hitachi 6600 PEG microscope operating in the secondary electron mode and using an accelerating voltage of 1 kV. 

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