Scanning near-field optical/atomic force

In the present review, first we will describe how to fabricate artificial photosynthetic reaction center in nanometer scales by making use of phase separation in mixed monolayers of hydrocarbon (HC) and fluorocarbon (FC) amphiphiles [2,5,20-26] as shown in Fig. 2b [3]. The phase separated structures were studied by SPMs such as AFM, SSPM, and scanning near-field optical/atomic force microscopy (SNOAM) [27-33] as well as a conventional local surface analysis by SIMS [3,5], The model anionic and cationic HC amphiphilic... 

SCANNING NEAR FIELD OPTICAL/ATOMIC FORCE MICROSCOPY (SNOW/AFM)—NOVEL IMAGING TECHNIQUE IN NANO-METER SCALE AND DNA-NANOFISH METHOD... 

Scanning near-field optical/atomic force nucrosoope (SNOM/AFM)... 

Scanning Near Field Optical/Atomic Force Microscopy... 

Ohtani T, Shichiri M, Fukushi D, Sugiyama S, YoshirK) T, Kobori T, Hagiwara S, Ushiki T. Imaging of chromosomes at nano-meta scale resolution using scanning near-field optical/atomic force microscopy. Arch Histol Cytol 2002 65 425-34. 

T. Ushdd, Scanning near-field optical/atomic force microscopy in biology, Presented at the 5th Asia-Pacific Conference on Near-Field Optics. Optical Society of Japan, Niigata, Japan, Paper 2-1, 15-17 November 2005... 

Ueda, A., O. Niwa, K. Maruyama, Y. Shindo, K. Oka, and K. Suzuki, Neurite imaging of living PC12 cells with scanning electrochemical/near-field optical/atomic force microscopy, Awgew. Chem., Int. Ed., Vol. 46, 2007 pp. 8238-8241. 

Mechanistic investigations of gas-solid and solid-solid reactions as well as their proper engineering require identifiable crystal surfaces for atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) [1,3, 13-15] in combination with X-ray diffraction data, which are the basis of crystal packing analyses [1,3,16-18]. 

Energy-dispersive X-ray microanalysis Surface analytical techniques Scanning near-field optical microscopy Scanning thermal microscopy Atomic force microscopy X-ray photoelectron spectroscopy... 

Schematic pictures showing the modes of operation of different probe microscopes, (a) An atomic force microscope and (b) a scanning near-field optical microscope.

Other scanned probe techniques such as atomic force microscopy may provide a type of spectroscopy by measuring the force on the tip as a function of distance, but are little used. The scanning near-field optical microscopy (SNOM) method can also provide standard far-field optical spectroscopy techniques but at an almost atomic resolution. 

Stiller B, et al. 2004. Optically induced mass transport studied by scanning near field optical and atomic force microscopy. Phys Low Dimens Str 1 2 129 137. 

SPM was invented in 1981 by G. Binnigand H. Rohrer, who won the Nobel Prize in Physics five years later for their invention. There are many kinds of SPMs, such as scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning near-field optical microscopy (SNOM), and magnetic force microscopy (MFM). All the SPMs are based on similar principles (Fig. 8), although each type of SPM employs a different probe and uses different mode of interaction with the sample surface (for more details about different SPMs, see Ref 7). 

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