Artifacts scanning electron microscopy

Kalab, M. 1984. Artifacts in conventional scanning electron microscopy of some milk products. Food Microstruct. 3(2), 95-111. 

Samples of microspheres were mounted on aluminum specimen mounts by means of double-faced tapes. The microspheres were fractured with razor blades to expose the internal matrix. The samples were then coated with approximately 125 of gold by pulsing the sputter coater to avoid the possibility of artifact caused by heat generation. Secondary emissive scanning electron microscopy was performed with an Amray 1600 Turbo scanning electron microscope. 

TEOS-derived gel is immersed in water. Unreacted TEOS present at the gel point phase separates into sufficiently large droplets that light scattering is observed (61). Artifacts of these droplets are observed by scanning electron microscopy (SEM) on fracture surfaces of the corresponding dried gels (61). 

See also-. Archaeometry and Antique Analysis Dating of Artifacts. Electrophoresis Overview. Fourier Transform Techniques. Gas Chromatography Pyrolysis. Mass Spectrometry Overview. Microscopy Techniques Light Microscopy Scanning Electron Microscopy. Thin-Layer Chromatography Overview. X-Ray Fluorescence and Emission Energy Dispersive X-Ray Fluorescence. 

More recently, the introduction of environmental scanning microscopy provided an important alternative which avoided drying artifacts, particularly in the foulant layer. Environmental scanning electron microscopy (ESEM) can operate in either high-vacuum mode (dried sample) or low-vacuum mode (hydrated conditions). Fully saturated water vapour conditions as high as 7kPa (SOTorr) and the elimination of any sample coating allow sample analysis without dehydration [42, 49]. 

Scanning electron microscopy preparations are generally direct and rapid, yet there are quite a number of potential artifacts. Paints, glues, and tapes used to attach the specimen to the SEM stub can wick up or contaminate the specimen surfaces, adding false structures to the... 

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