Scanning comparison

Martin RW, Bashein G (1989) Measurement of stroke volume with three-dimensional transesophageal ultrasonic scanning comparison with thermodilution measurement. Anesthesiology 70 470-476... 

Liang Y, Kruger RA (1996) Dual-shce spiral versus single-slice spiral scanning comparison of the physical performance of two computed tomography scanners. Med Phj 23 205-220... 

All described sensor probes scan an edge of the same material to get the characteristic step response of each system. The derivation of this curve (see eq.(4) ) causes the impulse responses. The measurement frequency is 100 kHz, the distance between sensor and structure 0. Chapter 4.2.1. and 4.2.2. compare several sensors and measurement methods and show the importance of the impulse response for the comparison. 

All the work is mechanised with an assigned scanning density, this allowing comparison of the UT results in repeated diagnostics of the constructions. Mechanical scanning practically eliminates overlooking of metal defects. Interpretation of the... 

Fig. 27. Scanning electron micrograph (a) and cross-sectional comparison (b) of screen and depth filters both having a nominal particulate cut-off of 0.4 flm. The screen filter (a Nuclepore radiation track membrane) captures particulates at the surface. The phase-inversion ceUulosic membrane traps the...

Microscopy is an unusual scientific discipline, involving as it does a wide variety of microscopes and techniques. All have in common the abiUty to image and enlarge tiny objects to macroscopic size for study, comparison, evaluation, and identification. Few industries or research laboratories can afford to ignore microscopy, although each may use only a small fraction of the various types. Microscopy review articles appear every two years m. Jinalytical Chemistty (1,2). Whereas the style of the Enclyclopedia employs lower case abbreviations for analytical techniques and instmments, eg, sem for scanning electron microscope, in this article capital letters will be used, eg, SEM. 

A. J. Bevolo. Scanning Electron Microscopy. 1985, vol. 4, p. 1449. (Scanning Electron Microscopy, Inc. Elk Grove Village, IL) Thorough exposition of the principles and applications of reflected electron energy-loss microscopy (REELM) as well as a comparison to other techniques, such as SAM, EDS and SEM. 

Figures Comparison of nuciear reactor and pulsed spaliation sources. For reactor sources (steady-state method), a narrow band of wavelengths is seiected with a monochromator crystal and the scattering angle (26,) Is varied to scan dspacings. Pulsed sources (time-of-flight method) use almost the entire avail-abie neutron spectrum, fix the scattering angie (26,), and simultaneousiy detect a neutron while determining its time of flight.

Perhaps the most significant complication in the interpretation of nanoscale adhesion and mechanical properties measurements is the fact that the contact sizes are below the optical limit ( 1 t,im). Macroscopic adhesion studies and mechanical property measurements often rely on optical observations of the contact, and many of the contact mechanics models are formulated around direct measurement of the contact area or radius as a function of experimentally controlled parameters, such as load or displacement. In studies of colloids, scanning electron microscopy (SEM) has been used to view particle/surface contact sizes from the side to measure contact radius [3]. However, such a configuration is not easily employed in AFM and nanoindentation studies, and undesirable surface interactions from charging or contamination may arise. For adhesion studies (e.g. Johnson-Kendall-Roberts (JKR) [4] and probe-tack tests [5,6]), the probe/sample contact area is monitored as a function of load or displacement. This allows evaluation of load/area or even stress/strain response [7] as well as comparison to and development of contact mechanics theories. Area measurements are also important in traditional indentation experiments, where hardness is determined by measuring the residual contact area of the deformation optically [8J. For micro- and nanoscale studies, the dimensions of both the contact and residual deformation (if any) are below the optical limit. 

VSP experiments allow the comparison of various process versions, the direct determination of the wanted reaction adiabatic temperature rise, and the monitoring of the possible initiations of secondary reactions. If no secondary reaction is initiated at the wanted reaction adiabatic final temperature, a further temperature scan allows the... 

An unknown analytical response in lettuce was detected61 and thought to contain P and S. The initial GC/MS Cl CH4 data were dominated by ions at m/z 121, 197 and 291 (equation 40). The GC/MS Cl NH3 data, however, indicated that perhaps the molecule had a higher molecular weight of 306 (MH+ equal to m/z 307, cf. equation 40). Comparison with the Cl CH4 and Cl NH3 spectra of demeton-S- (199) and demeton-O-sulfones showed, however, that the retention time and mass spectra of the former only matched the unknown (except the omission of the ion at m/z 307). On another stationary phase (OV-101) limited mass scanning of the ion at m/z 121 revealed a second unknown (200) eluting at 4.2 min (the major unknown, i.e. demeton-S-sulfone at 3.0 min). The molecular weight of 200 was believed to be 306. Because of the presence of ions at m/z 121,... 

ABP = 2-amino-5-bromophenyl(pyridin-2-yl)methanone 226,227 Absorbance, determination of 31 Absorption, measurement of 9,17,31 molar coefficient 36, 40 quantitative relationship 35, 36 recording of spectra 30, 31 -bathochromic/hypsochromic shift 31 -comparison to spectra of solutions 31 scanning curves 17,31,32 ACB = 2-amino-5-chlorobenzophenone 227... 

Sorenson TA, Lister TE, Huang BM, Stickney JL (1999) A comparison of atomic layers formed by electrodeposition of selenium and tellurium Scanning tunneling microscopy studies on Au(lOO) and Au(lll). J Electrochem Soc 146 1019-1027... 

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