Scanned Probe Microscopy information

A number of methods that provide information about the structure of a solid surface, its composition, and the oxidation states present have come into use. The recent explosion of activity in scanning probe microscopy has resulted in investigation of a wide variety of surface structures under a range of conditions. In addition, spectroscopic interrogation of the solid-high-vacuum interface elucidates structure and other atomic processes. 

Explain the principles of the scanning probe microscopies STM and AFM, and discuss the type of information these techniques provide. What are the major differences between the two ... 

The present version of the book represents a completely revised update of the first edition as it appeared in 1993. Significant new developments in e.g. the scanning probe microscopies, imaging and vibrational techniques called for revision and additions to the respective chapters. But also the other chapters have been updated with recent examples, and references to relevant new literature. Many figures from the first version of the book have been improved to make them more informative. The chapter with case studies has been expanded with an example on polymerization catalysts. 

The interested reader is referred to numerous other compendiums of information on this broad topic (1—5). Particulady noteworthy are the series of Fundamental Reviews on specific techniques that appear biennially in the joumal Analytical Chemistry. These Reviews report developments in specific fields since the previous report, and usually provide an up-to-date perspective of significant advances made in the field. Of particular relevance to this article are the Fundamental Reviews on surface analysis, scanning probe microscopy, and ir spectroscopy which have appeared recendy (5). 

Near-Field Scanning Optical Microscopy (NSOM) is a technique which enables users to work with standard optical tools integrated with scanning probe microscopy (SPM). The integration of SPM and certain optical methods allows for the collection of optical information at resolutions well beyond the diffraction limit. 

The usual objective of scanning probe microscopy techniques [41] is to provide images of a solid surface—normally topographic information— with up to atomic resolution. However, they can also be used to probe local solution composition and electrode reactions, as will be described. 

Scanning Probe microscopy techniques are extremely useful for analysing surfaces, but cannot lead to bulk information. They will be used each time surface properties are important, i.e. when surfaces are used for themselves (tribological applications, adhesion, etc.). However, in some cases, the study of transport phenomena (such as thermal or electrical conductivity) by modified AFM may lead to bulk characterisation such as the formation of a percolating nanotube network for instance. 

STM makes information on the surface structure of electrodes readily available, and hence turns out to be extremely helpful when tackling problems related to electrocatalysis and photoelectrochemistry. The development of further scanning probe microscopies is still an open and stimulating field of research in electrochemistry as well as in surface science. 

Investigations of molecular redox films are of fundamental importance to numerous technologies. Scanning probe microscopy, in combination with electrochemistry, is uniquely suited to provide invaluable information concerning the potential-dependent structural, chemical, and electronic properties on these systems. 

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