Rutherford back-scattering spectrometry

Terbium and europium have been incorporated into luminescent porous silicon (PS) by impregnation of PS layers in chloride solution of rare earth. The concentration dependencies of photoluminescence (PL) intensity are examined and Rutherford Back-scattering Spectrometry (RBS) measurements are performed. The excitation mechanisms of Eu and Tb ions in the PS matrix are discussed. [Pg.268]

STUDY OF LATTICE DISORDER DUE TO H+ AND LI+ IRRADIATION BY RUTHERFORD BACK SCATTERING SPECTROMETRY... [Pg.228]

Abstract Surface analyses have been one of the key technologies for corrosion control and surface finishing. It is very important that the most appropriate apparatus for the purpose of the analyses should be selected from various analytical techniques. In this chapter, surface analytical methods for corrosion control and surface finishing, such as X-ray fluorescence analysis (XRF), X-ray diffraction analysis (XRD), X-ray photo-electron spectroscopy (XPS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Auger electron spectroscopy (AES), Secondary ion mass spectrometry (SIMS), Rutherford back-scattering spectrometry (RBS), Surface-enhanced Raman spectroscopy (SERS), Fourier-transform infrared spectroscopy (FTIR), and so on, are briefly introduced. [Pg.47]

Transition metals in amorphous samples exhibit a direct interstitial diffusion behavior which was retarded by temporary trapping at defects that were intrinsic to the amorphous structure. Diffusion was investigated here by means of Rutherford back-scattering spectrometry. It was found that the data could be fitted by using foreign-atom interstitial diffusion coefficients for crystaHine Si modified by the presence of... [Pg.57]

The diffusion of ion-implanted Cs in thermally grown oxide was studied at 700 to 10OOC using Rutherford back-scattering spectrometry. Samples of Si were... [Pg.241]

The diffusion of Si was measured along the c-axis of P-phase quartz, at 1400 to 1600C, by using Rutherford back-scattering spectrometry and the Si(p,y) lp resonant nuclear reaction. It was found that the diffusivity could be described by ... [Pg.247]

Chemical diffusion under anhydrous conditions was measured in synthetic and natural rutile. Rutherford back-scattering spectrometry was used to measure diffusion profiles. For diffusion parallel to c, at 800 to lOOOC ... [Pg.257]

The diffusion of Mn was characterized using Rutherford back-scattering spectrometry. An Arrhenius relationship was obtained for Mn diffusion in natural Durango fluorapatite, for diffusion parallel to c ... [Pg.279]

Diffusion of the rare earth in natural and synthetic fluorapatite was characterized under anhydrous conditions. In the case of in-diffiision experiments, apatite was immersed in reservoirs of synthetic REE apatite analogs of various compositions. In out-diffusion experiments, synthetic Nd-doped apatite was immersed in a reservoir of synthetic (undoped) fluorapatite. The depth profiles were measured using Rutherford back-scattering spectrometry. For the in-diffusion experiments, at 800 to 1250C ... [Pg.279]

The diffusion of U was characterized by Rutherford back-scattering spectrometry. Experiments performed at 1000 to 1300C yielded an Arrhenius relationship for diffusion parallel to the c-axis ... [Pg.281]

Silicon diffusion was measured in anorthitic feldspar under dry low-pressure (0.1 MPa) conditions using a Si tracer. The sources of diffusant consisted of microcrystalline Si-doped synthetic feldspar of composition comparable to the feldspar specimens. Distributions of Si were measured using Rutherford back-scattering spectrometry and nuclear reaction analysis, using the reaction, Si(p,y) lp. The Arrhenius relationship, obtained for anneals at latm in air, was ... [Pg.287]

The diffusion of gallium was studied in yttrium aluminum garnet. The source of the diffusant was a mixture of gallium and yttrium oxides. The diffusion profiles were measured using Rutherford back-scattering spectrometry. The Arrhenius relationship... [Pg.287]

Mixtures of Pb sulfate and ground zircon were used as the sources of diffusant, and depth profiles were measured using Rutherford back-scattering spectrometry. At 1000 to 1500C, the Arrhenius relationship was ... [Pg.306]

According to the nuclear reaction analysis measurements. This agreed with the Arrhenius relationship determined using Rutherford back-scattering spectrometry measurements ... [Pg.306]

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