Reflectometrie interference spectroscopy

In contrast to SPFS, SPR, and SPDS are tools that can study biomolecular interactions without external labels. They share the same category of label-free biosensors with the reflectometry interference spectroscopy (RIfS) [46], waveguide spectroscopy [47], quartz crystal microbalance (QCM) [48], micro-cantilever sensors [49], etc. Although the label-free sensors cannot compete with SPFS in terms of sensitivity [11], they are however advantageous in avoiding any additional cost/time in labeling the molecules. In particular, the label-free detection concept eliminates undue detrimental effects originating from the labels that may interfere with the fundamental interaction. In this sense, it is worthwhile to develop and improve such sensors as instruments complementary to those ultra-sensitive sensors that require labels. 

A chemical sensor is a device that transforms chemical information into an analytically useful signal. Chemical sensors contain two basic functional units a receptor part and a transducer part. The receptor part is usually a sensitive layer, therefore a well founded knowledge about the mechanism of interaction of the analytes of interest and the selected sensitive layer has to be achieved. Various optical methods have been exploited in chemical sensors to transform the spectral information into useful signals which can be interpreted as chemical information about the analytes [1]. These are either reflectometric or refractometric methods. Optical sensors based on reflectometry are reflectometric interference spectroscopy (RIfS) [2] and ellipsometry [3,4], Evanescent field techniques, which are sensitive to changes in the refractive index, open a wide variety of optical detection principles [5] such as surface plasmon resonance spectroscopy (SPR) [6—8], Mach-Zehnder interferometer [9], Young interferometer [10], grating coupler [11] or resonant mirror [12] devices. All these optical... 

We developed an approach for analysis of reflectance spectra with bands of interference origin, for thin porous nanostructured layers on silicon wafers and made the automatic reflectometry equipment to examine optical characteristics (reflectance coefficient, refractive index) in the visible, near- infrared and mid- infrared range. The method is applied to por-Si, por-CoSi2 and por-A Os layers on c-Si substrate. The reflectance spectra, recorded at different light incidence angles permit to detect both the refractive index and layer thickness simultaneously. TEM, AFM, IR spectroscopy investigations of these layers confirmed the presence of Si nanocrystals. 

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