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Reflected light optical microscopic analysis

The apparatus used for IR microscopy is a Fourier-transform infrared (FTIR) spectrometer coupled on-line with an optical microscope. The microscope serves to observe the sample in white light at significant magnification for the purpose of determining its morphology, as well as to select the area for analysis. The spectrometer, on the other hand, enables study of the sample by transmission or reflection measurement for the purpose of determining the chemical composition. It also provides information about the microstructure and optical properties (orientation) of the sample. It is possible to apply polarised light both in the observation of the sample and in spectrometric measurements. [Pg.288]

Recent studies of micro ATR have defined the best experimental conditions for establishing optical contact between the ATR crystal and the sample [25]. This experimental approach has been applied to the analysis of the failure surfaces of adhesively bonded joints. ATR-microscopic measurements have been used for direct measurement and identification of raw materials in textiles coated and impregnated substances on paper [26]. An ATR microscopic probe has been developed which allows one to examine the sample optically through the probe in the microscope. The hemispheric ATR crystal is mounted at the focus of the Cassegrain objective, below the secondary mirror. One can position the crystal in contact with the sample, and run the spectra [27]. In the survey mode, visible light at nearly normal incidence is selected to locate the area of measurement. In the contact mode, low incident angle visible is used to detect contact of the sample to the ATR crystal surface. In the measurement mode, the ATR crystal is slid into position and the incident beam is optimized for total internal reflection. In the Spectra Tech version, all of the available crystals, i.e. ZnSe, Diamond, Silicon, and Germanium can be used. However, Ge and Si are opaque and cannot be used in the survey or contact mode. An optical contact sensor can be used. [Pg.94]


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Light Reflectance

Light microscope

Light reflectivity

Light-optical microscope

Microscopes, reflecting

Microscopic analysis

Optical analyses

Optical microscope

Optical microscopic

Optical reflectivity

Optics reflective

Reflected light

Reflected light microscope

Reflection optics

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