Pulsed radiofrequency glow discharge time-of-flight mass

A. C. Muniz, J. Pisonero, L. Lobo, C. Gonzalez, N. Bordel, R. Pereiro, A. Tempez, P. Chapon, N. Tuccitto, A. Licciardello and A. Sanz-Medel, Pulsed radiofrequency glow discharge time of flight mass spectrometer for the direct analysis of bulk and thin coated glasses, J. Anal. At. Spectrom., 23, 2008, 1239-1246. [Pg.50]

Pisonero, J., Lobo, L., Bordel, N., Tempez, A., Bensaoula, A., Badi, N., Sanz Medel, A. (2010) Quantitative depth profile analysis of boron implanted silicon by pulsed radiofrequency glow discharge time-of-flight mass spectrometry. Solar Energy Mater. Solar Cells, 94, 1352-1357. [Pg.957]

The authors have a complementary cross-disciplinary expertise in material science, MS technology, ionization mechanisms, and instrumentation development. Most of the authors were partners of the EMDPA project, an acronym for Elemental and Molecular Depth Profiling Analysis by pulsed radiofrequency (RF) glow discharge time-of-flight mass spectroscopy (GD-TOFMS) within the European Union (EU) FP6 work program [5]. [Pg.943]

Big Chemical Encyclopedia