Plasma deposited films, electronic devices

Despite such limitations, plasma-deposited a-C(N) H films were found to be used in a number of applications. The stress reduction induced by nitrogen incorporation [12] and consequent adhesion improvement, allowed the development of a-C(N) H antireflective coatings for Ge-based infrared detectors [13]. It was also found that N can electronically dope a-C H films, and can strongly decrease the defect density, which gives prospects on its use as a semiconductor material [14]. Nitrogen incorporation was also found to decrease the threshold electric field in electron-field emission process [15], making possible the use of a-C(N) H films as an overcoat on emission tips in flat-panel display devices [16]. 

The requirements of thin-film ferroelectrics are stoichiometry, phase formation, crystallization, and microstmctural development for the various device appHcations. As of this writing multimagnetron sputtering (MMS) (56), multiion beam-reactive sputter (MIBERS) deposition (57), uv-excimer laser ablation (58), and electron cyclotron resonance (ECR) plasma-assisted growth (59) are the latest ferroelectric thin-film growth processes to satisfy the requirements. 

This work reports the development of a polymeric/sol-gel route for the deposition of silicon carbide and silicon oxycarbide thin films for applications such as heat-, corrosion-, and wear-resistant coatings, coatings on fibers for controlling the interaction with the matrix in ceramic matrix composites, or films in electronic and optoelectronic devices. This method, in which the pre-ceramic films are converted to a ceramic coating either by a conventional high temperature annealing or by ion irradiation, is alternative to conventional methods such as chemical or physical vapor deposition (CVD, PVD), molecular beam epitaxy, sputtering, plasma spray, or laser ablation, which are not always practical or cost efficient. 

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