Scanned probe microscopy

Atomic Force Microscopy Scanning Probe Microscopy... [Pg.768]

The already critical need for molecular-scale compositional mapping will increase as more complex structures are assembled. Currently, electron microscopy, scanning probe microscopy (SPM) and fluorescence resonance energy transfer (FRET) are the only methods that routinely provide nanometer resolution. [Pg.146]

Scanning electron microscopy, scanning probe microscopy, ATR-IR spectroscopy, contact angle measurements... [Pg.74]

Shape Electron microscopy Scanning probe technologies... [Pg.1305]

Small-angle neutron scattering Transmission electron microscopy Scanning probe technologies Membrane and vapor pressure osmometry Light-scattering methods Nuclear magnetic resonance... [Pg.1306]

Light microscopy X-ray diffraction Electi on microscopy Scanned probe microscopy Neuti on diffraction Surface analytical methods... [Pg.4]

AFM/SPM Atomic Force Microscopy Scanning Probe Microscopy Surface imaging with near atomic spatial resolution Atomic scale morphology 0.1 A 50 A... [Pg.152]

Electronics electrical engineering physics oj> tical physics atomic physics mathematics statistics imj e analysis materials science photomicrogp aphy interferometry electromagnetics quantum electrodynamics computer science nanotechnology metallography electron microscopy optical microscopy scanning probe microscopy cell biology chemistry. [Pg.1214]

Scanning Probe Microscopy. Scanning probe microscopy abandons lenses altogether and makes use of very fine mechanical tips, or probes, attached to a cantilever. The probes delicately scan back and forth over the surface of the specimen being studied in order to inspect it. Scanning probe microscopes can deliver information about not only the topography of an object but also its internal properties. Some can even map a specimen s properties on a nanoscale. [Pg.1217]

First attempts to record the micro/nanomechanical surface properties with atomic force microscopy/scanning probe microscopy (AFM/SPM) probing were conducted by using the classical Sneddon s approach [1-3]. Further development lead to the micromapping of the surface mechanical properties with a force modulation mode [4-8]. Several studies were focused on the development of dc force-displacement probing of the micromechanical properties [9-15]. In this communication, we report on studies of the micromechanical properties of composite films of polystyrene/polybutadiene (PS/PB) and grafted PS layers and prove the feasibility of... [Pg.254]

Like electron microscopy, scanning probe microscopy (SPM) also opens a window into the world of nanometer-sized specimens and, in some cases, provides details at the atomic level. One version of SPM is scanning tunneling microscopy (STM), in which a platinum-rhodium or tungsten needle is scanned across the surface of a conducting solid. When the tip of the needle is brought very close to the surface, electrons tunnel across the intervening space (Fig. 9.23). [Pg.329]

Charged-Particle Optics Particle Size Analysis Positron Microscopy Scanning Probe Microscopy Transmission Electron Microscopy X-Ray Analysis X-Ray Photoelectron Spectroscopy... [Pg.205]

Elaborate synthetic approaches have been developed that enable significant control over the size and shape of palladium nanostructures. In order to understand the properties of the materials formed based on the preparation method, several characterization techniques have been used. These include electron microscopy, scanning probe microscopy (SPM), nuclear magnetic resonance (NMR) spectroscopy, ultraviolet-visible (UV-Vis) spectroscopy, infrared (IR) spectroscopy, electrochemistry, X-ray diffraction (XRD), thermogravimetric analysis (TGA), electron diffraction, photoelectron spectroscopy, dynamic light scattering (DLS), extended X-ray absorption fine structure (EXAFS), BET surface area analysis andX-ray reflectivity (XRR). In the following section we will describe the information provided by each of these characterization techniques. [Pg.329]

The geometric and surface properties of supported nanostructures (nanoparticles, nanorods, and other nanoscale objects) are closely related to many of their important applications. On relatively inert substrates, such as graphite, oxides, and nitrides, many nanostmctures can be fabricated in a nearly free-standing state by simple physical vapor deposition, and be characterized using electron microscopy, scanning probe microscopy, and various spectroscopic methods. Their intrinsic properties, including the interaction among them, can be measured. In addition, the nanostructures on an inert support provide us with an arena to examine their interactions with other nanoobjects, such as biomolecules, without the influence of a solution. [Pg.118]