Lawrence Berkeley National sourcing research

Sciences de TUnivers. His research interests focus on environmental mineralogy and biogeochemistry of metal contaminants and trace elements using X-ray structural techniques. In the mid-80s, he initiated a new research program on the structure and surface reactivity of poorly crystallized Fe oxides. In the early 90s, this program was extended to Mn oxides, and specifically to minerals of the bimessite family. In the mid-90s, he pioneered the application of synchrotron techniques to determination of the speciation of heavy metals in natural systems. In the last two years, he was a key developer of an X-ray microprobe at the Advanced Light Source of the Lawrence Berkeley National Laboratory dedicated to the study of complex environmental materials. He is also co-lead PI of the French Absorption spectroscopy beamline in Material and Environmental sciences (FAME) at the European Synchrotron Radiation Facility (ESRF) in Grenoble. 

Nobumichi Tamura (left) obtained his Ph.D. in 1993 at the Institut National Polytechnique de Grenoble (INPG) for his work on the structure of quasicrystals and crystalline approximant phases. In 1998 he moved to Oak Ridge National Laboratory to contribute to the development of a new synchrotron-based X-ray microfocus technique capable of resolving strain and texture in thin films with submicrometer spatial resolution. He applied this technique in the field of microelectronics. He is currently staff scientist at the Lawrence Berkeley National Laboratory, where he leads the X-ray microdiffraction project at the Advanced Light Source. His research interest is presently focused on the study of mechanical properties of thin films at mesoscopic scale using synchrotron radiation. 

The authors Choi, Lee, and Tu would like to thank the Semiconductor Research Corporation contract NJ-853 (Dr. Harold Hosack), and National Semiconductor Corporation (Dr. Luu Nguyen) for the financial support for the research described in this chapter. The authors would also like to thank George T.T. Sheng and C.F. Hu at Macronix International Company, Hsinchu, Taiwan, for some of the focus ion beam images of Sn whiskers. They would also like to thank N. Tamura at Advanced Light Source, Lawrence Berkeley National Laboratory for X-ray microdiffraction study of Sn whiskers. 

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