Interference effect, optical

While electron or ion beam techniques can only be applied under ultra-high vacuum, optical techniques have no specific requirements concerning sample environment and are generally easier to use. The surface information which can be obtained is, however, quite different and mostly does not contain direct chemical information. While with infra-red attenuated total reflection spectroscopy (IR-ATR) a deep surface area with a typical depth of some micrometers is investigated, other techniques like phase-measurement interference microscopy (PMIM) have, due to interference effects, a much better surface sensitivity. PMIM is a very quick technique for surface roughness and homogeneity inspection with subnanometer resolution. 

An important consideration for the direct physical measurement of adhesion via pull-off measurements is the influence of the precise direction of the applied force. In AFM the cantilever does not usually lie parallel to the surface, due to the risk that another part of the cantilever chip or chip holder will make contact with the surface before the tip. Another problem relates to the fact that the spot size in the optical beam deflection method is usually larger than the width of the lever. This can result in an interference effect between the reflection from the sample and the reflection from the cantilever. This is reduced if the cantilever and sample are not parallel. Most commercial AFM systems use an angle in the range of 10°-15° between the sample and the cantilever. Depending on this angle and the extent to which the cantilever is bent away from its equilibrium position, there can be a significant fraction of unintentional lateral forces applied to the contact. 

Figure 3.70 Room temperature optical absorption spectra of a 45(X)A-lhick film of neutral polypyrrole doped with at0.03 torr. (a) before exposure to I2, conductivity <10 6fl 1cm"1 (b) after 2 minutes I2 exposure, conductivity 4.8 ft em 1 (c) after 7 minutes exposure, conductivity 6,7 ft em 1 (d) after 22 minutes I2 exposure, conductivity 32ft cm The three structures seen on the low-energy side of (a) (c) arc possibly artifacts due to interference effects in the films. From Pfluger et at. (1983).

In the present experiment, the optical fiber is aligned to the sensor chip using a separate micropositioner, and no antireflection coatings are used on the chip facets. As a result, the observed noise floor is limited by vibrations and interference effects of the present experimental setup. With the adoption of well-established packaging... 

In this chapter, the motivations to adopt MLR systems for optical e-beam, x-ray, and ion-beam lithographic systems will be given, followed by a survey of published MLR systems. Specific practical considerations such as planarization, pinhole and additive defects, interfacial layer, etch residue, film stress, interference effects, spectral transmission, inspection and resist stripping will be discussed. The MLR systems will be compared in terms of resolution, aspect ratio, sensitivity, process complexity and cost. 

The schematic processing steps for the two-layer deep-UV PCM system are shown in Table III for near-UV and e-beam exposures, resulting in capped and uncapped profiles respectively. Step 5a is required only for near-UV exposures to average out optical interference effects discussed in Section 6.2.a. Step 6a is used to enhance the AZ to PMMA adhesion and cap retention. Figure 15 shows uncapped 1 - nm lines in a 2 - /im thick PMMA layer. Figure 16 shows the capped image with 0.3 fim AZ on 2 -iLim PMMA. The AZ layer was delineated by a 30 - /iC/cm 25 - keV e-beam in both cases. 

The refractive index is the most important optical property and its effect in determining the appearance of the polymer composite has already been referred to above. Amorphous fillers such as glass fibres and beads have only one refractive index, but most mineral fillers are crystalline and have anisotropic crystal structures resulting in a number of different indices, and this can cause complex and undesirable interference effects [27]. 

The essential principle of coherent control in the continuum is to create a linear superposition of degenerate continuum eigenstates out of which the desired process (e.g., dissociation) occurs. If one can alter the coefficients a of the superposition at will, then the probabilities of processes, which derive from squares of amplitudes, will display an interference term whose magnitude depends upon the a,. Thus, varying the coefficients a, allows control over the product properties via quantum interference. This strategy forms the basis for coherent control scenarios in which multiple optical excitation routes are used to dissociate a molecule. It is important to emphasize that interference effects relevant for control over product distributions arise only from energetically degenerate states [7], a feature that is central to the discussion below. 

S. Mukamel I would like to make a comment regarding interference effects in quantum and classical nonlinear response functions [1, 2]. Nonlinear optical measurements may be interpreted by expanding the polarization P in powers of the incoming electric field E. To nth order we have... 

RIfS was used to characterise changes in the optical thickness A(nd) of a polymeric sensitive layer. RIfS is based on interference effects in thin transparent films. By interaction of analyte molecules with the sensitive layer, a swelling takes place and so the interference pattern is changed [21],... 

Ross, B.S., and Hieftje, G.M. (1991) Alteration of the ion-optic lens configuration to eliminate mass-dependent matrix interference effects in inductively coupled plasma-mass spectrometry Spectrochim. Acta 46B, 1263-1273. 

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