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Thickness, optical

L = mean beam length Eq, at vanishingly small optical thickness ... [Pg.570]

Clouds of Nonblack Particles The correction for nonblackness of the particles is complicated by multiple scatter of the radiation reflected by each particle. The emissivity . of a cloud of gray particles of individual surface emissivity 1 can be estimated by the use of Eq. (5-151), with its exponent multiplied by 1, if the optical thickness alv)L does not exceed about 2. Modified Eq. (5-151) would predict an approach of . to 1 as L 0°, an impossibihty in a scattering system the asymptotic value of . can be read from Fig. 5-14 as /, with albedo (0 given by particle-surface refleclance 1 — 1. Particles with a perimeter lying between 0.5 and 5 times the wavelength of interest can be handledwith difficulty by use of the Mie equations (see Hottel and Sarofim, op. cit., chaps. 12 and 13). [Pg.582]

Here, oR is the Raman cross section, a constant whose magnitude depends on the excitation and collection geometry. In optically thick media, as in a geometrically thin but optically dense tissue, a deviation from the linear Raman response of Is versus concentration N is to be expected. This can... [Pg.89]

Figure 4. Reflectometric interference spectroscopy (RIFS) caused by constructive and destructive superposition of two partial beams being reflected at the two interfaces of a thin layer (300 nm - some pm), shift of the interference spectrum caused by a change in the optical thickness. Figure 4. Reflectometric interference spectroscopy (RIFS) caused by constructive and destructive superposition of two partial beams being reflected at the two interfaces of a thin layer (300 nm - some pm), shift of the interference spectrum caused by a change in the optical thickness.
Figure 5. Binding curves time-resolved measurement of the change in optical thickness during association. The second part of the figure shows the regeneration which returns the signal hack to the baseline. Figure 5. Binding curves time-resolved measurement of the change in optical thickness during association. The second part of the figure shows the regeneration which returns the signal hack to the baseline.
If Time resolved detection at 96 spots S Time resolution 25 s > Regeneration results in original values for optical thickness... [Pg.234]

The developed sensor was used for ultrathin-film measurement. The reflection spectrum was shifted during the deposition of thin films (e.g., self-assembly of polyelectrolyte layers) onto the sensor end. The reflection between the thin film and the fiber endface was neglected because of their similar refractive indices. As the film increased its thickness, the length of the fiber cavity changed. The amount of change was estimated by the phase shift of the interferogram. The device could also be used as an immunosensor in which the optical thickness changes were used to... [Pg.151]

Fig. 9.6 The calculated effective index change in the silicon PWEF waveguide of Fig. 9.3 induced by adsorbed films of constant optical thickness (a) Dopt 0.4 nm and (b) Dopt 0.1 nm for film thickness between 0.5 and 16 nm. As the film thickness changes, the refractive index is adjusted so that the optical thickness remains constant. For comparison, the graphs also show 8iVeff and the corresponding SPR angle shift A6 for an SPR experiment... Fig. 9.6 The calculated effective index change in the silicon PWEF waveguide of Fig. 9.3 induced by adsorbed films of constant optical thickness (a) Dopt 0.4 nm and (b) Dopt 0.1 nm for film thickness between 0.5 and 16 nm. As the film thickness changes, the refractive index is adjusted so that the optical thickness remains constant. For comparison, the graphs also show 8iVeff and the corresponding SPR angle shift A6 for an SPR experiment...
Therefore Z)opt provides a convenient single parameter that can be used to estimate the response of guided modes to very thin adsorbed layers. To assess and compare surface sensitivity, in this chapter, we will use the differential change of mode effective index with the optical thickness ... [Pg.240]

Unlike the dependence of Aeff on film thickness alone (dNc /dd) that is sometimes used as a figure of merit for guided mode molecular sensors, 5m0d captures both the index and thickness dependence of the sensor response in a single parameter. While Dopt does not uniquely determine the film response for other optical techniques such as ellipsometry and reflectance difference, once d and n of the film are known, the optical thickness can be evaluated and comparisons are made between guided mode sensors and other techniques. [Pg.240]

The interferometry trace shows the change in the optical thickness of the polymer film with respect to time. Both the completion of the polymer film dissolution and the DR can be determined. [Pg.387]

With the appropriate fiber-optic probe and data processing techniques, UV-vis spectroscopy may be used to determine the optical thickness of a transparent thin film. It is possible to simultaneously measure thickness of different layers in a multilayer structure as long as each layer falls within the analysis range of the instrument. Typically, this means layers in the 0.5-150/rm range. A further constraint on this technique is that the layer structure of the film must be smooth on the scale of the spot size of the fiber-optic probe. Neighboring layers must have different indices of refraction in order for them to appear as distinct layers to the analyzer. [Pg.99]

Figure 4.8 Comparison of optical thickness measurements to a physical technique. Figure 4.8 Comparison of optical thickness measurements to a physical technique.
It should be noted that scattering of light by particles can be measured using remote sensing techniques on satellites, from which such parameters as total aerosol optical thickness i.e., the exponent (bcxlL) in... [Pg.367]

Tegen, I., and I. Fung, Modeling of Mineral Dust in the Atmosphere Sources, Transport, and Optical Thickness, J. Geophys. Res., 99, 22897-22914 (1994). [Pg.841]

For optically thick samples, which is the more interesting case applicable to the majority of experiments, Eqs. (1) — (3) have to be combined with the photon-transport equation ... [Pg.6]


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Atmosphere, optically thick

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Light scattering optical thickness

Optical film thickness monitor

Optical thickness, change

Optically thick

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Optically thick media

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Optically thick sources

Thickness and Optical Properties of Layers on Solid Supports

Thickness and optical constants

Thickness and the optical constants

Thickness optical transmittance

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