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Infrared spectroscopy silicon compounds

In 1985 Allara and Nuzzo [354, 355] published the results of an extensive investigation in which adsorption took place on to an aluminium oxide layer formed on a film of aluminium deposited in vacuo on to a silicon wafer. Various carboxylic acids were dissolved in high purity hexadecane and allowed to adsorb from this solution on to the prepared aluminium oxide surface. The monolayers so formed were examined by ellipsometry and infrared spectroscopy. Contact angle measurements were made on the monolayer surfaces and radioactive labelled (tritiated) compounds were employed to study the interchange of adsorbed molecules with those in solution. Various other techniques of less immediate relevance to our present interests were also employed and reference to these two papers should be made for further particulars. Aluminium... [Pg.117]

Infrared spectroscopy has certain limitations when applied to organosilicon compounds First, non-silicon substituents present in small amounts may be overlooked. Secondly, infrared is not very sensitive to differences in molecular weight or molecular weight distribution. [Pg.413]

Since different compounds permeate the membranes with different rates, spectral interference can be reduced [60], The membrane materials, used for that purpose, include polypropylene, poly(tetrafluoroethylene), cellulose, silicone rubber, dimethylvinyl silicone, polyethylene, and zeolite. The membrane can be interfaced to the mass spectrometer in different configurations - directly or with the aid of a sweep gas. Using MIMS, the sampling probe can be taken away from the mass spectrometer to which it is connected by a tube. Therefore, sampling of various environmental matrices can be conducted in situ. In fact, portable MIMS systems can be used as monitors, providing vital information which is not offered by other technologies (e.g., fluorescence, infrared spectroscopy) [64]. [Pg.108]

Atomic absorption spectrometry (AAS), atomic emission spectrometry (AES) [11], infrared (IR), Fourier transform infrared (FTIR) and Raman spectroscopy have all been studied at various times for the determination of silicon compounds. AAS has been used to determine silicon in methylisobutylketone, chloroform or petroleum ether extracts of packaging materials and foodstuffs [12-17]. However, these methods suffer from the disadvantage that they do not distinguish between organic and inorganic silicon compounds, similarly inductively coupled plasma AES measures total silicon [11]. [Pg.119]

As for silicon, secondary ion mass spectrometry (SIMS) is the most widely used profiling analysis technique for deuterium diffusion studies in III-V compounds. Deuterium advantageously replaces hydrogen for lowering the detection limit. The investigations of donor and acceptor neutralization effects have been usually performed through electrical measurements, low temperature photoluminescence, photothermal ionization spectroscopy (PTIS) and infrared absorption spectroscopy. These spectroscopic investigations will be treated in a separated part of this chapter. [Pg.465]

Photomultipliers -cesium in [CESIUMAND CESIUM COMPOUNDS] (Vol5) -m infrared technology [INFRARED TECHNOLOGY AND RAMAN SPECTROSCOPY - INFRARED TECHNOLOGY] (Vol 14) -for optical spectroscopy [SPECTROSCOPY, OPTICAL] (Vol 22) -silicon carbide m [CARBIDES - SILICON CARBIDE] (Vol 4) -use m kinetic measurements [KINETIC MEASUREMENTS] (Vol 14) -usem optical spectroscopy [SPECTROSCOPY, OPTICAL] (Vol 22)... [Pg.758]

Biphenyl Fraction. The low molecular weight compounds, soluble in isooctane and hot methanol, were primarily biphenyl and o-, m-, and p-terphenyl. These products were identified by gas-liquid chromatography using a silicone gum rubber column (Figure 4) and a Carbowax 20M column with appropriate standards. The components were trapped and analyzed by infrared and NMR spectroscopy for confirmation. Biphenyl was present in sufficient quantity to be readily detected in the initial infrared spectrum and was isolated by sublimation. Quantitative data, obtained using the silicone column with appropriate calibration curves are presented in Table III. With the possible exception of biphenyl, the yields are very low considering the overall conversion noted. The o-, m-, and p-terphenyl ratio (1/0.4/1) indicates a preference for the para position beyond that expected for random attack. [Pg.311]

General discussion of intra- and intermolecular interactions 3 van der Waals interactions 3 Coulombic interactions 5 Medium effects on conformational equilibria 5 Quantum mechanical interpretations of intramolecular interactions 7 Methods of study 8 Introduction 8 Nmr and esr spectroscopy 8 Microwave spectroscopy (MW) 12 Gas-phase electron diffraction (ED) 12 X-ray crystallographic methods 13 Circular-dichroism spectroscopy and optical rotation 14 Infrared and Raman spectroscopy 18 Supersonic molecular jet technique 20 Ultrasonic relaxation 22 Dipole moments and Kerr constants 22 Molecular mechanic calculations 23 Quantum mechanical calculations 25 Conformations with respect to rotation about sp —sp bonds 27 Carbon-carbon and carbon-silicon bonds 28 Carbon-nitrogen and carbon-phosphorus bonds 42 Carbon-oxygen and carbon-sulphur bonds 48 Conformations with respect to rotation about sp —sp bonds Alkenes and carbonyl derivatives 53 Aromatic and heteroaromatic compounds 60 Amides, thioamides and analogues 75 Conclusions 83 References 84... [Pg.1]

A. P. Kreshkov, Y. Y. Mikhailenko, and G. F. Kakimovich, Qualitative Analysis of Silicon Organic Compounds by Means of Infrared Absorption Spectroscopy, Zhur. Anal. Khim. 9, 208-216,1954 cf. CA 47, 2646d. [Pg.404]


See other pages where Infrared spectroscopy silicon compounds is mentioned: [Pg.517]    [Pg.418]    [Pg.637]    [Pg.138]    [Pg.40]    [Pg.9]    [Pg.202]    [Pg.414]    [Pg.557]    [Pg.811]    [Pg.823]    [Pg.75]    [Pg.882]    [Pg.453]    [Pg.156]    [Pg.773]    [Pg.587]    [Pg.84]    [Pg.472]    [Pg.528]    [Pg.34]    [Pg.885]    [Pg.457]    [Pg.513]    [Pg.21]    [Pg.159]    [Pg.224]    [Pg.84]    [Pg.67]    [Pg.415]    [Pg.342]   
See also in sourсe #XX -- [ Pg.379 , Pg.422 ]




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