Images, real time

Parbhu, A., Lin, H., Thimm, J., and Lai, R. 2002. Imaging real-time aggregation of amyloid beta protein [1-42] by atomic force microscopy. Peptides 23,1265-1270. 

DRAI (R.), BENTALEB (N.), ABDAT (F.), SELLIDJ (F), Application of real time ultrasonic imaging method for control of materials, Atmales de Chimie - Sciences des materiaux. Vol.22, 143, 1997. 

Additional assistance is provided by secondary modification options that allow among others for a depiction of the original signal, the reconstruction of the depiction of the impedance plane of the eddy-current signals or for modifications of phase, amplification or zero point virtually in real time. That way, once C-scan images have been recorded, they can now be evaluated as needed without having to repeat the test. 

It would be tlierefore thus easy to obtain in real time, on computer, tlie image of a long standard defect that is to even to produce the impedance variation observed. It would be thus possible to realize the control by absolute measures and to avoid the recourse to standard defects. 

Real Time Radiography (RTR) is an advanced method of radiography in which the image is formed while the job is exposed to ionising radiation. RTR is often applied to objects on assembly lines for rapid inspection. Accept-or-reject decisions may be made immediately without the delay or expense of film development. The main advantages of RTR are thus, reduction in inspection cost and processing time. 

Of all NTD methods for quality control of materials, products, welded and soldered joints the most informative and perspective are radioscopic ones that enable to obtain a visual image of an inner structure of a tested objects in real time under any projection. 

The lead time for making a image by film X-Ray is 10 to 15 minutes. Where about 2 minute are needed in inspection by Real-Time X-Ray. Another advantage of Real-Time X-Ray is the feature that the effect of manipulating the part or changing the setting of the X-Ray tube can be observed directly. This is often used in investigating quality problems. 

Real Time X-Ray images are stored on CD ROM/XA. Compared to film the volume for a storage is reduced by a factor 50. Retrieving is easy since information of the location is given in the directory of the diskette. Normally the directory name is the shop order and the file name is the serial number of the part. The directory and file names can be customised. 

The resolution of images of the Real Time X-Ray system depend on the material thickness and on the settings of the system. While setting up the Real Time X-Ray inspection of parts the resolution is compared with the resolution aehieved in film bases X-Ray as used over the last years. It is demonstrated that the sensitivity of Real Time X-Ray meets the specification of DIN 54109 Bildgtitteklasse II. 

An advantage of Real Time X-Ray is that since only one section of the part is inspected at the time the X-Ray parameter settings can be optimised per section. At the same time each section is irradiated almost perpendicular which gives less distortion in the image of the top and the bottom section of blades. 

In Real Time X-Ray inspection a positive image is used. It takes an operator who is used to the negative image of film X-Ray less than one hour to get used to a positive image. 

The study presented a new tomographic method based on 3D reconstruction from a single 180 exposure. The method is based on the summation principle and the 3D voxel image is generated almost in real-time. 

Doering, E.R. Basart,. I.P. Gray,. I.N. Three-dimensional flaw reconstruction and dimensional analysis using a real-time X-ray imaging system. NDT-I-E International, Vol. 26(1), 1993, pp. 7-17. 

Nijnieijer, M.C, Boer, M.A. Correction of lens-distortion for real-time image processing systems. VLSI Signal Processing VI... 

The field ion microscope (FIM) has been used to monitor surface self-diflfiision in real time. In the FIM, a sharp, crystalline tip is placed in a large electric field in a chamber filled with Fie gas [14]. At the tip. Fie ions are fonned, and then accelerated away from the tip. The angular distribution of the Fie ions provides a picture of the atoms at the tip with atomic resolution. In these images, it has been possible to monitor the diflfiision of a single adatom on a surface in real time [15]. The limitations of FIM, however, include its applicability only to metals, and the fact that the surfaces are limited to those that exist on a sharp tip, i.e. difhision along a large... 

The diffraction pattern observed in LEED is one of the most connnonly used fingerprints of a surface structure. Witii XRD or other non-electron diffraction methods, there is no convenient detector tliat images in real time the corresponding diffraction pattern. Point-source methods, like PD, do not produce a convenient spot pattern, but a diffrise diffraction pattern that does not simply reflect the long-range ordermg. 

Commercially available photon tunneling microscopes have a lateral resolution of 160 nm but subnanometer vertical resolution. The nondestmctive, instantaneous 3-D viewing of a surface (no scanning) yields real-time imaging as one traverses a given sample. The sample must be a dielectric, but transparent polymer tepHcas of opaque samples can be studied. 

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