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High-energy scans

In this equation xL is the high-energy scan limit, and we have defined the number of electrons uniformly scattered from energy above xL as... [Pg.141]

SHEED Scanning high-energy electron diffraction [106] Scanning version of HEED Surface heterogeneity... [Pg.313]

Accelerating voltage (high voltage) scan. An alternative method of producing a momentum (mass) spectrum in magnetic-deflection instruments. This scan can also be used, in conjunction with a fixed radial electrical field, to produce an ion kinetic energy spectrum. [Pg.433]

The selective uptake of iodide ion by the thyroid gland is the basis of radioiodine treatment in hyperthyroidism, mainly with although various other radioactive isotopes ate also used (40,41). With a half-life of eight days, the decay of this isotope produces high energy P-particles which cause selective destmction within a 2 mm sphere of their origin. The y-rays also emitted are not absorbed by the thyroid tissue and are employed for external scanning. [Pg.52]

Reflected High Energy Electron Diffraction Scanning Reflection Electron Microscopy... [Pg.768]

Figures 3a-f show the emission and excitation spectra for all six humic fractions. The excitation and emission maxima are listed in Table III along with the maxima of the phase-resolved emission spectra. In each case the emission spectrum was scanned with the excitation maximum wavelength held constant, and the excitation spectrum was scanned with the emission maximum wavelength held constant. Several interesting features are noted. The two humic samples ( Figures 3a,b) each have two excitation maxima and it appears that a double peak has been merged into the emission scan as evidenced by the shoulder on the high energy side of the emission peak. Similarly it seems evident that the exaggerated shoulders in the emission spectra of all the fractions point to the inclusion of two emission peaks in each spectrum. This evidence suggests the presence of two chromophores in each humic fraction. Figures 3a-f show the emission and excitation spectra for all six humic fractions. The excitation and emission maxima are listed in Table III along with the maxima of the phase-resolved emission spectra. In each case the emission spectrum was scanned with the excitation maximum wavelength held constant, and the excitation spectrum was scanned with the emission maximum wavelength held constant. Several interesting features are noted. The two humic samples ( Figures 3a,b) each have two excitation maxima and it appears that a double peak has been merged into the emission scan as evidenced by the shoulder on the high energy side of the emission peak. Similarly it seems evident that the exaggerated shoulders in the emission spectra of all the fractions point to the inclusion of two emission peaks in each spectrum. This evidence suggests the presence of two chromophores in each humic fraction.
SAM is a combination of the techniques of SEM and AES an electron beam of high energy (3-10 keV) is scanned over the surface and the electrons excited from the... [Pg.175]

MS/MS Duty Cycle Typical MS/MS analysis is a serial process, relying on the selection of precursors (peptides) in MS mode, followed by high-energy fragmentation in MS/MS. This process is termed data dependent acquisition (DDA). The duty cycle for the completion of MS and MS/MS cycles (the time necessary for MS/MS spectrum acquisition) is of primary importance. When the separation performance is viewed from the mass spectrometry perspective, the peak capacity can be characterized by the number of MS/MS scans, yielding successful... [Pg.280]

With linked scan MS/MS, another analyzer is not required, but this mode gives either limited precursor selectivity with unit product-ion resolution, or unit precursor selection with poor product-ion resolution. Four-sector instruments can give very high quality data, but are costly, very space demanding, and complex. Hybrids like sector-TOF or sector-QFT are good (and cheaper) alternatives. High-energy CID MS/MS spectra are very reproducible (see Chapter 3). [Pg.49]

For single crystal substrates which are not in the form of thin films, the techniques of transmission microscopy and nanodiffraction can not be used. For such cases, the techniques of reflection electron microscopy (REM) or its scanning variant (SREM) and reflection high energy electron diffraction (RHEED), in the selected area or convergent beam modes, may be applied (18). [Pg.352]


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See also in sourсe #XX -- [ Pg.411 ]




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