Grazing electron microscopy

Two-dimensional (2-D) crystallites are generally of a lower symmetry than 3-D crystals. The molecules in the 2-D crystallites cannot pack across a center of inversion as they most commonly do in 3-D. By applying modern analytical tools such as scanning tunneling and probe microscopy (STM, SPM), transmission electron microscopy (TEM), grazing incidence X-ray diffraction (GIXD), electrospray ionization (ESI) and matrix-assisted laser-... 

To obtain the morphology information, including phase separation and crystalline, we can now use microscopic techniques, atomic force microscopy, transmission electron microscopy, electron tomography, variable-angle spectroscopic ellipsometry. X-ray photoemission spectroscopy, and grazing-incidence X-ray diffraction. The detailed information of this characterization methods can be found from the specific reference (Li et al., 2012 Huang et al., 2014). 

J., Kjaer, K., Lahav, M., and Leiserowitz, L., Structured nuclei of 4-(octadecyloxy)benzoic acid monolayer for induced nucleation of 4-hydroxybenzoic add monohydrale as determined by grazing incidence X-ray diffraction on the aqueous solution, J. Phys. Chem., 99, 6036, 1995. (c) Majewski, J., Margulis, L., Weissbuch, 1., Popovitz-Biro, R., Arad, T., Talmon, Y., Lahav, M., and Leiserowitz, L., Electron microscopy studies of amphiphilic self assembUes on vitreous ice, Adv. Mater., 1, 26, 1995. 

Scheme 9.1 Methods in morphology characterization. TEM transmission electron microscopy EF-TEM energy filter transmission electron microscopy STXM scan transmission X-ray microscopy GISAXS grazing incidence small-angle X-ray scattering SANS small-angle neutron scattering RSoXS resonant soft X-ray scattering SEM scanning electron microscopy DSIMS dynamic secondary ion mass spectroscopy XR X-ray reflectivity NR neutron reflectivity VASE variable angle spectroscopic ellipsometry.

Diffraction techniques (low-energy electron diffraction [34, 35], helium diffraction [36, 37] and grazing incidence X-ray diffraction [38]), scanning tunneling microscopy (STM) [36, 39, 40] and atomic force microscopy (AFM) [41] served to solidify the conclusions inferred from the less direct spectroscopic methods and provide additional structural details. The sulfur atoms order epitaxially on the substrate in a (x/3 X V3) R30° structure [36-38, 40, 41]. The angle of the sulfur-carbon bond with respect to the substrate plane is approximately 104° for alkanethiol monolayers [38, 42] and 180° for arylthiol SAMs [42, 43]. Given the agreement between the results obtained from direct structural methods and indirect spectroscopic methods, one... 

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