Gates or Gate

FTA is a deductive method that uses Boolean logic symbols (i.e., AND gates, OR gates) to break down the causes of the top event into basic equipment failures and human errors. The analysts begin with the top event and identify the causes and the logical relationships between the causes and the top event. Each of the causes, called intermediate events, is examined in the same manner until the basic causes for every intermediate event have been identified. 

Three-methods have been pursued to organize monolayers from different organic compounds to form molecular monolayer FETs (1) thermal evaporation of approximately monolayer thickness on the dielectric surface of FETs, (2) Langmuir-Blodgett assembly on the water surface and transfer to device surfaces, and (3) self-assembly of functionalized organic compounds on the surface of the gate, or gate dielectric layers of FETs. 

This funnel is placed to encompass and direct the flow of contaminated water to a "gate" or "gates" containing a permeable zone of granular Fe° or other reactive material. 

Differential inverter gate AND gate OR gate amplifier... 

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