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Field Emission Scanning Electron Microscopy FESEM

2 Field Emission Scanning Electron Microscopy (FESEM) [Pg.128]


A Dektak siuface profilometer was used to measure the etch rates. The profiles of the etched films were observed by field emission scanning electron microscopy (FESEM). In addition, x-ray photoelectron spectroscopy PCPS) was utilized to examine the existence of possible etch products or redeposited materials, and to elucidate the etch mechanism of Co2MnSi magnetic films in a CVOa/Ar plasma. [Pg.378]

Fig. 8 Different views of T. foetus hydrogenosomes ( ) after field-emission scanning electron microscopy (FESEM) (a) and freeze-etching (b,c). An isolated hydrogenosome obtained from T. foetus observed by FESEM, where details of its surface can be seen, b A calcium deposit in the peripheral vesicle (asterisk) c shows that the peripheral vesicle (arrow) presents a smooth surface, distinct from the organelle body. Bars = 50 nm. (From Benchimol 2000)... Fig. 8 Different views of T. foetus hydrogenosomes ( ) after field-emission scanning electron microscopy (FESEM) (a) and freeze-etching (b,c). An isolated hydrogenosome obtained from T. foetus observed by FESEM, where details of its surface can be seen, b A calcium deposit in the peripheral vesicle (asterisk) c shows that the peripheral vesicle (arrow) presents a smooth surface, distinct from the organelle body. Bars = 50 nm. (From Benchimol 2000)...
Field emission scanning electron microscopy (FESEM), glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy (TEM), micro Raman scattering, Fourier transform inftaied (FTIR) spectrometry, Rutherford back scattering (RBS) studies and electron probe micro analysis (EPMA) have been carried out to obtain micro-structural and compositional properties of the diamond/p-SiC nanocomposite films. Atomic force microscopy (AFM) and indentation studies have been carried out to obtain film properties on the tribological and mechanical front. [Pg.372]

The brazed Joints were mounted in epoxy, ground, polished, and examined using Field Emission Scanning Electron Microscopy (FESEM) (model Hitachi 4700) coupled with energy dispersive x-ray spectroscopy (EDS). Microhardness scans were made with a Knoop indenter across the joint interfaces on a Struers Duramin-A300 machine under a load of 200 g and loading time of 10 s. Multiple (4 to 6) hardness scans were made across each joint to check the reproducibility. [Pg.495]

Field emission scanning electron microscopy (FESEM) images of (a) patterned polyacrylic acid (PAA), (b) patterned jxrlystyrene (PS) on patterned 11-amino-l-imdecanethiol hydrochloride (MUAM) (-NH3+)/octadecanethiol (ODT) (-CF13) monolayers. (Reprinted with permission from Wiley.)... [Pg.311]

Field emission scanning electron microscopy (FESEM) images of directed assembly of polystyrene (PS)/polyacrylic acid (PAA) blends using alternative MUAM/octadecanethiol (ODT) patterns with various periodicities (a-d) 1333, (e-h) 1000, (i-1) 667, and (m-p) 333 nm. The solution concentrations were changed (a,e,i,m) 1, (b,f,j,n) 0.8, (c,g,k,o) 0.6, and (d,h,l,p) 0.4 wt%. Q stands for the critical solution concentration for each pattern periodicity. (Reprinted with permission from ACS.)... [Pg.316]

Metal films evaporated onto glass can be examined by using molecular spectroscopy and methods such as field emission scanning electron microscopy (FESEM), atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). The characterization of organic surfaces has been reviewed by Perry and Somorjai. ... [Pg.730]

Detailed stractural examinaticm is essential to investigate the potential of cellulose nanofibre as reinforcement in polymer composites. Several characterization techniques were used to study the ultrasfructure of cellulose obtained from various sources. Various techniques such as TEM, field emission scanning electron microscopy (FESEM), SEM, AFM and wide-angle X-ray scattering (WAXS) have been used to characterise the morphology of cellulose nanofibres. TEM and AFM aid... [Pg.28]


See other pages where Field Emission Scanning Electron Microscopy FESEM is mentioned: [Pg.218]    [Pg.190]    [Pg.84]    [Pg.530]    [Pg.241]    [Pg.110]    [Pg.947]    [Pg.243]    [Pg.74]    [Pg.243]    [Pg.199]    [Pg.486]    [Pg.494]    [Pg.554]    [Pg.530]    [Pg.75]    [Pg.46]    [Pg.428]    [Pg.563]    [Pg.311]    [Pg.312]    [Pg.320]    [Pg.233]    [Pg.103]    [Pg.77]    [Pg.15]    [Pg.292]    [Pg.43]    [Pg.2079]   
See also in sourсe #XX -- [ Pg.222 , Pg.273 , Pg.283 , Pg.286 ]




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Electron emission

Electron field

Electron field-emission

Electronic field emission

Electronic fields

FESEM electron microscopy

FESEM microscopy

FESEM scanning electron

FIELD EMISSION SCANNING MICROSCOPY

Field electron emission microscopy

Field emission

Field emission microscopy

Field emission scanning electron microscopy

Field microscopy

Microscopy, field electron

Scanning electron microscopy

Scanning electron microscopy FESEM

Scanning electronic microscopy

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