Electron elemental mapping

Care must be taken in interpreting the intensity distribution, because the electron intensity depends not only on the local concentration of the element but on the topography also, because surface roughness can affect the inelastic background underneath the line. Therefore elemental maps are customarily presented as variations of the ratio of peak intensity divided by the magnitude of the background on both or one side of the line this can easily be performed by computer. 

A variation on depth profiling that can be performed by modern scanning Auger instruments (see Sect. 2.2.6) is to program the incident electron beam to jump from one pre-selected position on a surface to each of many others in turn, with multiplexing at each position. This is called multiple point analysis. Sets of elemental maps acquired after each sputtering step or each period of continuous sputtering can be related to each other in a computer frame-store system to derive a three-dimensional analysis of a selected micro volume. 

If an incident electron beam of sufficient energy for AES is rastered over a surface in a manner similar to that in a scanning electron microscope (SEM), and if the analyzer is set to accept electrons of Auger energies characteristic of a particular element, then an elemental map or image is again obtained, similar to XPS for the Quantum 2000 (Sect. 2.1.2.5). 

Element mapping with non-resonant laser- SNM S can be used to investigate the structure of electronic devices and to locate defects and microcontaminants [3.114]. Typical SNMS maps for a GaAs test pattern are shown in Fig. 3.43. In the subscript of each map the maximum number of counts obtained in one pixel is given. The images were acquired by use of a 25-keV Ga" liquid metal ion source with a spot size of approximately 150-200 nm. For the given images only 1.5 % of a monolayer was consumed -"static SNMS". 

Analytical electron microscopy (AEM) can use several signals from the specimen to analyze volumes of catalyst material about a thousand times smaller than conventional techniques. X-ray emission spectroscopy (XES) is the most quantitative mode of chemical analyse in the AEM and is now also useful as a high resolution elemental mapping technique. Electron energy loss spectroscopy (EELS) vftiile not as well developed for quantitative analysis gives additional chemical information in the fine structure of the elemental absorption edges. EELS avoids the problem of spurious x-rays generated from areas of the spectrum remote from the analysis area. 

Application. Anomalous X-ray diffraction (AXRD), anomalous wide-angle X-ray scattering (AWAXS), and anomalous small-angle X-ray scattering (ASAXS) are scattering methods which are selective to chemical elements. The contrast of the selected element with respect to the other atoms in the material is enhanced. The phase problem of normal X-ray scattering can be resolved, and electron density maps can be computed. 

Fig. 5.16 (A) Bright-field TEM image and (B) element mapping carbon (brighter contrast corresponds to higher concentration of carbon) of ZnO synthesized in aqueous solution at 37 °C in pH 8 buffer for 4 h in the presence of 1.2 mgmL-1 of gelatin. The inset shows the electron diffraction pattern taken parallel to the platelet normal. (Reprinted with permission from [77], Copyright (2006) American Chemical Society).

Four samples were similarly selected for the EPMA experiments. The samples were dried and embedded in polished epoxy cylindrical plugs. Backscattered electron (BSE) images as well as elemental maps of As, Fe and Ni (EDS/WDS) were collected using a JEOL 8600 Superprobe electron microprobe analyzer (Dept, of Geological Sciences, University of Saskatchewan). 

XI. Energy Filtered Transmission Electron Microscopy and Elemental Maps of... 

Fig. 10. X-ray elemental map in the electron microscope of metal-substituted aluminophosphate (MAPO-36 (with M = Zn)) catalyst. The map shows a uniform distribution of the elements in the sample.

Figure 6. X-ray elemental maps obtained using an electron microscope—urban dust sample containing automotive exhaust particles...

The favoured dihedral angles for protein main chains were derived from energy considerations of steric clashes in peptides giving the well known Ramachandran plot (Ramachandran and Sasisekharan, 1968). These phi/psi combinations characterize the elements of secondary structure. Accurate main chain models can be constructed from spare parts, that is short pieces of helices, sheets, turns, and random coils taken from highly refined structures, provided a series of C-alpha positions can be established from the electron density map... 

Fig. 6. Element maps of Ce, Nd, and P demonstrating the high REE content of the secondary apatite. The elevated REE concentrations lead to the high contrast of the apatite in the backscattered electron (BSE) image.

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