Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Electron dispersive spectroscopy

X-ray dii action spectra of the samples were recorded with a PW 1050 Philips spectrometer with Co Ka incident radiation. Transmission electron micrographs and electron dispersion spectroscopy (EDS) analysis were obtained with a Philips CM 12 instrument equipped with Philips 9100 attachment. [Pg.333]

SEM analysis was carried out to examine the fracture and bond characteristics of hardened concretes produced from different sandstone aggregates. The concrete samples for SEM analysis were dried at 105 C for 24 h. The dried concrete samples were carefully broken. Ereshly fractured surfaces were coated with gold in a vacuum evaporator. They were examined by a Scanning Electron Microscope (SEM) to determine morphological and minera-logical features. SEM images were also fitted with Electron Dispersive Spectroscopy (EDS). [Pg.250]

Figure 8.5 (a) Electron dispersive spectroscopy (EDS) spectra for the dried chitosan film with... [Pg.199]

Determination of the relative concentration of the elements in the deposit, using electron dispersive spectroscopy (EDS) may not be enough, particularly when one of the alloying elements is in a high valency state, such as in WOj , because partial reduction to the oxide rather than the metal may be involved. It may be necessary to employ X-ray photoelectron spectroscopy (XPS), to determine the chemical state of each element in the alloy. [Pg.311]

A scanning electron microscope can also be equipped with additional instmmentation for electron-excited x-ray analysis (9). In many systems, this is performed in the mode known as energy dispersive x-ray analysis (edx). Other common acronyms for this method are eds for energy dispersive spectroscopy or edax for energy dispersive analysis of x-rays. [Pg.271]

The incoming electron beam interacts with the sample to produce a number of signals that are subsequently detectable and useful for analysis. They are X-ray emission, which can be detected either by Energy Dispersive Spectroscopy, EDS, or by Wavelength Dispersive Spectroscopy, WDS visible or UV emission, which is known as Cathodoluminescence, CL and Auger Electron Emission, which is the basis of Auger Electron Spectroscopy discussed in Chapter 5. Finally, the incoming... [Pg.117]

Catalysts were characterized using SEM (Hitachi S-4800, operated at 15 keV for secondary electron imaging and energy dispersive spectroscopy (EDS)), XRD (Bruker D4 Endeavor with Cu K radiation operated at 40 kV and 40 mA), TEM (Tecnai S-20, operated at 200 keV) and temperature-programmed reduction (TPR). Table 1 lists BET surface area for the selected catalysts. [Pg.60]

Secondly, the characteristic X-rays, emitted as the electrons displaced from the inner shells of the atoms are replaced, can be detected by use of an energy-sensitive detector placed close to the specimen. An account of the application of both the energy dispersive spectroscopy (EDS) of the emitted X-rays and EELS to the... [Pg.332]

EPMA is a technique for chemically analysing small selected areas of solid samples, in which X-rays are excited by a focused electron beam. Spatial distribution of specific elements can be recorded as two-dimensional X-ray maps using either energy dispersive spectroscopy (EDS) or... [Pg.343]

Although a number of secondary minerals have been predicted to form in weathered CCB materials, few have been positively identified by physical characterization methods. Secondary phases in CCB materials may be difficult or impossible to characterize due to their low abundance and small particle size. Conventional mineral identification methods such as X-ray diffraction (XRD) analysis fail to identify secondary phases that are less than 1-5% by weight of the CCB or are X-ray amorphous. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM), coupled with energy dispersive spectroscopy (EDS), can often identify phases not seen by XRD. Additional analytical methods used to characterize trace secondary phases include infrared (IR) spectroscopy, electron microprobe (EMP) analysis, differential thermal analysis (DTA), and various synchrotron radiation techniques (e.g., micro-XRD, X-ray absorption near-eidge spectroscopy [XANES], X-ray absorption fine-structure [XAFSJ). [Pg.642]

Kamiya et al. [83] evaluated particulate contamination in 199 samples of admixed and un-admixed parenteral nutrition solution bags from 10 hospitals in Japan. Seven samples were used as controls since they had not been mixed with ampoules or vials (un-admixed samples). Size and number of particles were measured using a particle counter, and the identification of elements was carried out by scanning electron microscopy coupled to energy dispersion spectroscopy. The authors collected the residual volume of the samples (10-60 mL) after their usage. The results are presented in Table 40. [Pg.523]


See other pages where Electron dispersive spectroscopy is mentioned: [Pg.445]    [Pg.422]    [Pg.257]    [Pg.625]    [Pg.393]    [Pg.445]    [Pg.422]    [Pg.257]    [Pg.625]    [Pg.393]    [Pg.1306]    [Pg.224]    [Pg.451]    [Pg.183]    [Pg.634]    [Pg.392]    [Pg.399]    [Pg.610]    [Pg.382]    [Pg.444]    [Pg.160]    [Pg.227]    [Pg.618]    [Pg.7]    [Pg.223]    [Pg.5]    [Pg.317]    [Pg.10]    [Pg.212]    [Pg.20]    [Pg.442]    [Pg.683]    [Pg.686]    [Pg.229]    [Pg.410]   
See also in sourсe #XX -- [ Pg.803 , Pg.842 , Pg.848 ]

See also in sourсe #XX -- [ Pg.311 ]




SEARCH



Electron disperse

Electron disperse spectroscopy

Electron disperse spectroscopy

Electron dispersion

Electron dispersity

Electron dispersive X-ray spectroscopy

Electron dispersive spectroscopy analysis

Electron dispersive spectroscopy phase chemistry

Electron energy dispersive-spectroscopy

Electron spectroscopy, monolayer dispersion

Scanning electron microscopy energy dispersive X-ray spectroscopy

Spectroscopy dispersive

© 2024 chempedia.info