Electron beam, wavelength

The incoming electron beam interacts with the sample to produce a number of signals that are subsequently detectable and useful for analysis. They are X-ray emission, which can be detected either by Energy Dispersive Spectroscopy, EDS, or by Wavelength Dispersive Spectroscopy, WDS visible or UV emission, which is known as Cathodoluminescence, CL and Auger Electron Emission, which is the basis of Auger Electron Spectroscopy discussed in Chapter 5. Finally, the incoming... 

The short wavelength of x-rays naturally makes them difficult to focus. Electrons, on the other hand, can rather easily be controlled to give beams a few square microns in cross section, a fact that made possible the x-ray emission electron-microprobe (9.9). Clearly, such a concentrated electron beam striking one side of a suitable thin target can give rise to an x-ray spot on the other, and this spot can be small enough to be regarded as a point source of x-rays. 

Wavelength shift of K absorption edge of sulfur, 37, 38 Weight-fraction , use, 164, 171 Window absorption, 45 Windowless counter tube, 55, 222 Windows, for electron beam, 177 for proportional counter, 55... 

When an electron beam strikes a block of copper, x-rays with a frequency of 1.2 X lO1 Hz are emitted. How much energy is emitted at this wavelength by (a) an excited copper atom when it generates an x-ray photon (b) 2.00 mol of excited copper atoms (c) 2.00 g of copper atoms ... 

Spherical rollers were machined from AISI 52100 steel, hardened to a Rockwell hardness of Rc 60 and manually polished with diamond paste to RMS surface roughness of 5 nm. Two glass disks with a different thickness of the silica spacer layer are used. For thin film colorimetric interferometry, a spacer layer about 190 nm thick is employed whereas FECO interferometry requires a thicker spacer layer, approximately 500 nm. In both cases, the layer was deposited by the reactive electron beam evaporation process and it covers the entire underside of the glass disk with the exception of a narrow radial strip. The refractive index of the spacer layer was determined by reflection spectroscopy and its value for a wavelength of 550 nm is 1.47. 

Electron microscopy is a rather straightforward technique to determine the size and shape of supported particles [S. Amelinckx, D. van Dyck, J. van Landuyt and G. van Tendeloo, Handbook of Microscopy (1997), VCH, Weinheim]. Electrons have characteristic wavelengths of less than 1 A, and come close to monitoring atomic detail. Figure 4.13 summarizes what happens when a primary electron beam of energy between 100 and 400 keV hits a sample ... 

The terms elastic and inelastic scattering of electrons describe that which results in no loss of energy and some measureable loss of energy respectively. If the incident electron beam is coherent (i.e. the electrons are in phase) and of a fixed wavelength, then elastically scattered electrons remain coherent and inelastic electrons are usually incoherent. 

The modern theory of the electronic structure of the atom is based on experimental observations of the interaction of electricity with matter, studies of electron beams (cathode rays), studies of radioactivity, studies of the distribution of the energy emitted by hot solids, and studies of the wavelengths of light emitted by incandescent gases. A complete discussion of the experimental evidence for the modern theory of atomic structure is beyond the scope of this book. In this chapter only the results of the theoretical treatment will be described, These results will have to be memorized as rules of the game, but they will be used so extensively throughout the general chemistry course that the notation used will soon become familiar. 

Because of the much shorter wavelength of electron beams, the Ewald sphere becomes practically planar in electron diffraction, and diffraction spots are expected in this case which would only appear in X-ray diffraction if the specimen were rotated. 

Excitation of sample by bombardment with electrons, radioactive particles or white X-rays. Dispersive crystal analysers dispersing radiation at angles dependent upon energy (wavelength), detection of radiation with gas ionization or scintillation counters. Non-dispersive semiconductor detectors used in conjunction with multichannel pulse height analysers. Electron beam excitation together with scanning electron microscopes. 

Seeing the surface of a catalyst, preferably in atomic detail, is the ideal of every catalytic chemist. Unfortunately, optical microscopy is of no use for achieving this, simply because the rather long wavelength of visible light (a few hundred nanometers) does not enable features smaller than about one micrometer to be detected. Electron beams offer better opportunities. Development over the past 40 years has resulted in electron microscopes which routinely achieve magnifications on the order of one million times and reveal details with a resolution of about 0.1 nm [1], The technique has become very popular in catalysis, and several reviews offer a good overview of what electron microscopy and related techniques tell us about a catalyst 12-6],... 

Transmission electron microscopy (TEM) is a powerful and mature microstructural characterization technique. The principles and applications of TEM have been described in many books [16 20]. The image formation in TEM is similar to that in optical microscopy, but the resolution of TEM is far superior to that of an optical microscope due to the enormous differences in the wavelengths of the sources used in these two microscopes. Today, most TEMs can be routinely operated at a resolution better than 0.2 nm, which provides the desired microstructural information about ultrathin layers and their interfaces in OLEDs. Electron beams can be focused to nanometer size, so nanochemical analysis of materials can be performed [21]. These unique abilities to provide structural and chemical information down to atomic-nanometer dimensions make it an indispensable technique in OLED development. However, TEM specimens need to be very thin to make them transparent to electrons. This is one of the most formidable obstacles in using TEM in this field. Current versions of OLEDs are composed of hard glass substrates, soft organic materials, and metal layers. Conventional TEM sample preparation techniques are no longer suitable for these samples [22-24], Recently, these difficulties have been overcome by using the advanced dual beam (DB) microscopy technique, which will be discussed later. 

---