Backscattering analysis

Doolittle L R 1986 A semiautomatic algorithm for Rutherford backscattering analysis Nucl. Instrum. Methods B 15 227... 

We have found that hydrophilic oiganic polymers treated with TiCLi have much higher etching selectivities than organosilicon polymers in an O2 plasma. This paper examines some of the parameters that influence the reaction of TiCLi with a variety of polymers. We find that TiCLi, readily functionalizes hydrophilic as well as moderately hydrophobic polymers, but fails to functionalize very hydrophobic films. Rutherford backscattering analysis reveals that TiCl4 is hydrolyzed at hydrophilic polymer surfaces that have sorbed water. Lack of surface water on hydrophobic polymers explains the absence of a TiC>2 layer on these polymer surfaces. 

Ion Induced x-ray. Auxiliary techniques may be used to obviate some of the difficulties or limitations of backscattering analysis outlined above. One such technique is ion induced x-ray analysis, a relatively simple technique to apply in an... 

This paper describes a process for activating polyimide surfaces for electroless metal plating. A thin surface region of a polyimide film can be electro-chemically reduced when contacted with certain reducing agent solutions. The electroactivity of polyimides is used to mediate electron transfer for depositing catalytic metal (e.g., Pd, Pt, Ni, Cu) seeds onto the polymer surface. The proposed metal deposition mechanism presented is based on results obtained from cyclic voltammetric, UV-visible, and Rutherford backscattering analysis of reduced and metallized polyimide films. This process allows blanket and full-additive metallization of polymeric materials for electronic device fabrication. 

FIr. 2.12. Examples of thickness of an amorphous interlayer growing in bilaycr diffusion couples of Ni/Zr and Ni/Hf as a function of (l 2. The thickness of the amorphous layer was determined in both cases using Rutherford backscattering analysis. The Ni/Hf bilayer was reacted at a temperature of 340 C [2.79], while the Ni/Zr bilayer at 280 C [2.42]... 

Scanning transmission electron microscopy (STEM) uses X-ray backscattering analysis to obtain information on the size, morphology, and chemical composition of the active components on support materials (Fig. 5-47). 

Correct identification of plaque types depends on their structure, composition and sufficient image resolution. Recent work in IVUS backscatter analysis demonstrates the capability of IVUS to characterize specific lesions and identify the kinds of plaques that lead to various clinical syndromes [25,26]. Other techniques, such as wavelet analysis and elastography [27], are being developed to identify plaque composition as well. These techniques have been used to identify plaque composition and geometry using IVUS. The advances in IVUS have allowed for automated quantitative analysis of vessel... 

Dong Y, Forster B, Ticehurst C (1997) Radar backscatter analysis for urban environments. Int J Remote Sens 18(6) 1351-1364... 

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