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Diffraction line intensity

Plot a curve similar to that of Fig. 6-3 showing the absorption of Fe Ka radiation by air. Take the composition and density of air from Prob. 1-8. If a 1-hr exposure in air is required to produce a certain diffraction line intensity in a 19-cm-diameter camera with Fe Ka. radiation, what exposure is required to obtain the same line intensity with the camera evacuated, other conditions being equal ... [Pg.186]

In the measurement of diffraction line intensity, it is essential that the integrated intensity, not the maximum intensity, be measured. Large variations in line shape can occur because of variations in microstrain and grain size. These variations in line shape will not affect the integrated intensity, but they can make the values of maximum intensity absolutely meaningless. [Pg.414]

A quantitative X-ray analysis allows to calculate the stoichiometric coefficient of the reaction when plotting the molar ratio ZnO/CrCl3 versus diffraction line intensity ratios ... [Pg.131]

Powder X-ray diffraction has been applied to quantitative phase analysis (hereafter called QPA) for over 80 years. It seems that the first mention of QPA was made by Hull in the paper A new method of chemical analysis , published in 1919 in the Journal of the American Chemical Society. At this early stage, quantitative X-ray diffraction (QXRD) was based on a comparison of diffraction line intensities for the analyzed sample with a series of mixtures containing known amounts of the analyte. [Pg.5152]

Figure 7. Relative diffraction line intensity F and specific surface area S V5 MA duration for y- (A,C) and X-AI2O3 (B,D). Activation with (A,B) and without (C,D) heat elimination. Figure 7. Relative diffraction line intensity F and specific surface area S V5 MA duration for y- (A,C) and X-AI2O3 (B,D). Activation with (A,B) and without (C,D) heat elimination.
In the case of a crystalline phase in an amorphous matrix, a rough measure of their ratio can be obtained if the compositions are known. This is accomplished by summing the powder diffraction line intensities, subtracting the amorphous (background) intensity, and correcting for Compton-modified scattering. The fact that there is a continuous spectrum of order from well-crystallized to noncrystalline phases is an inherent limitation to the method. [Pg.457]

Silver acetylide decomposition was studied [679] by X-ray diffraction and microscopic measurements and, although the a—time relationship was not established, comparisons of intensities of diffraction lines enabled the value of E to be estimated (170 kj mole 1). The rate-limiting step is believed to involve electron transfer and explosive properties of this compound are attributed to accumulation of solid products which catalyze the decomposition (rather than to thermal deflagration). [Pg.156]

SA) was appeared when Mn contents increased to y>l. Continuous shift of diffraction line was hardly observable in this region, but relative intensities of these phases were changed. It indicates... [Pg.421]

The analysis of XRPD patterns is an important tool studying the crystallographic structure and composition of powder compounds including the possibility to study deviation from ideal crystallinity, i.e. defects. Looking at an X-ray powder diffractogram the peak position reflects the crystallographic symmetry (unit cell size and shape) while the peak intensity is related to the unit cell composition (atomic positions). The shape of diffraction lines is related to defects , i.e. deviation from the ideal crystallinity finite crystallite size and strain lead to broadening of the XRPD lines so that the analysis of diffraction line shape may supply information about sample microstructure and defects distribution at the atomic level. [Pg.130]

The position of diffraction line, as well as the location of its maximum I(26o), is the most commonly used parameter to quantify the lattice parameters and interplane distances. The full width of intensity distribution at half maximum F (FWHM) is the simplest measure of the peak breadth. An alternative method estimates the peak width... [Pg.130]

The diffraction lines due to the crystalline phases in the samples are modeled using the unit cell symmetry and size, in order to determine the Bragg peak positions 0q. Peak intensities (peak areas) are calculated according to the structure factors Fo (which depend on the unit cell composition, the atomic positions and the thermal factors). Peak shapes are described by some profile functions 0(2fi—2fio) (usually pseudo-Voigt and Pearson VII). Effects due to instrumental aberrations, uniform strain and preferred orientations and anisotropic broadening can be taken into account. [Pg.135]

X-ray diffraction with facilities for determining the intensity profile of each diffraction line is particularly informative. Criteria which have been adopted as evidence of good bulk homogeneity (54) are (1) a correct lattice constant eto, and (2) a symmetrical X-ray diffraction profile. A method has also been described (30) for determining if a range of lattice... [Pg.139]

From the examples we have discussed, it is evident that quantitative x-ray diffractometric work has conventionally been carried out using a few high-intensity diffraction lines (one exception being the analyses of intact tablets, Section... [Pg.216]

The XRD pattern of a powdered sample is measured with a stationary X-ray source (usually Cu Ka) and a movable detector, which scans the intensity of the diffracted radiation as a function of the angle 2 6 between the incoming and the diffracted beams. When working with powdered samples, an image of diffraction lines occurs because a small fraction of the powder particles will be oriented such that by chance a certain crystal plane is at the right angle 6 with the incident beam for constructive interference (see Fig. 6.1). [Pg.154]

Specimens of different stoichiometries were prepared, in some cases with the addition of 20 mass% alumina powder introduced as heat sink to reduce the reaction violence. For the 1 1 NiAl alloy a record for a total time of 4.3 seconds was reported. Diffraction lines of Ni (111, 200) and A1 (111) were detected at the beginning then, when the reaction front penetrated the irradiated zone, A1 melted and its line disappeared Ni was wetted (and the intensities of its lines decreased) and the temperature jumped from 660°C to about 1400°C, as shown by the shift of the diffraction lines toward lower angles, with the appearance of the NiAl diffraction lines and subsequent cooling. [Pg.570]

The x-ray powder diffraction pattern of cortisone acetate was obtained using a Siemens D 5000 x-ray diffractometer system. The incident radiation was provided by a copper tube, yielding X = 1.5480 A. The powder pattern thusly obtained is presented in Figure 1, and the scattering angles, interplanar distances, and peak relative intensities are collected in Table 2 for diffraction lines whose relative intensity exceeds 4%. [Pg.187]

This material may be removed by reheating the sample to 850°, followed by the same annealing procedure outlined above. The X-ray diffraction pattern for 2H(a)-TaS2 may be used for identification. The following d values have been obtained for major low angle X-ray diffraction lines (and intensities) 6.05 (1) 3.025 (0.06) 2.8709 (0.32) 2.7933 (0.07) 2.3937 (0.80) and 2.3389 (0.04) A. Note that it is difficult to obtain the ideal intensities because of preferred orientation of the crystallites. This material is a superconducting metal with Te = 0.8 0.05°K.2... [Pg.38]

A method known as Rietveld analysis has been developed for solving crystal structures from powder diffraction data. The Rietveld method involves an interpretation of not only the line position but also of the line intensities, and because there is so much overlap of the reflections in the powder patterns, the method developed by Rietveld involves analysing the overall line profiles. Rietveld formulated a method of assigning each peak a gaussian shape and then allowing the gaussians to overlap so that an overall... [Pg.107]

Hydrolysis of Alkoxides - A different thermal evolution of the precursor phase was observed for a BaAli20i9 sample prepared via hydrolysis of alkoxides.8,9 For this sample no XRD diffraction lines were detected after heating at 1000°C. At 1200°C Ba-hexaaluminate formed, and it was the only phase detected in the XRD spectra. Calcination at 1450 °C resulted in higher sharpness and intensity of the XRD reflection of Ba-hexaaluminate. No further changes were observed upon calcination at 1600°C. Also in this case, the appearance of Ba-(3-Al203 was accompanied by a marked drop of surface area. However, the... [Pg.93]


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Diffraction intensity

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