Diffraction atomic force microscopy

Caldwell, W. B., Campbell, D. j., Chen, K. M., Herr, B. R., Mirkin, C. A., Malik, A., Durbin, M. K., Dutta, P., and Huang, K. G. A highly ordered self-assembled monolayer film of an azobenzenealkanethiol on Au(Ill) - Electrochemical properties and structural characterization by synchrotron in-plane X-ray-diffraction, atomic-force microscopy, and surface-enhanced Raman-spectroscopy. J. Am. Chem. Soc. 1995 117, 6071-6082 ... 

We have considered briefly the important macroscopic description of a solid adsorbent, namely, its speciflc surface area, its possible fractal nature, and if porous, its pore size distribution. In addition, it is important to know as much as possible about the microscopic structure of the surface, and contemporary surface spectroscopic and diffraction techniques, discussed in Chapter VIII, provide a good deal of such information (see also Refs. 55 and 56 for short general reviews, and the monograph by Somoijai [57]). Scanning tunneling microscopy (STM) and atomic force microscopy (AFT) are now widely used to obtain the structure of surfaces and of adsorbed layers on a molecular scale (see Chapter VIII, Section XVIII-2B, and Ref. 58). On a less informative and more statistical basis are site energy distributions (Section XVII-14) there is also the somewhat laige-scale type of structure due to surface imperfections and dislocations (Section VII-4D and Fig. XVIII-14). 

In this section, the thin-film formation of OPVs is investigated with optical microscopy and X-ray diffraction (XRD). In the case of Oocl-OPV5, this has been supplemented with surface imaging by means of atomic force microscopy. It is demonstrated how an annealing treatment of the films alter deposition influences... 

Film-forming chemical reactions and the chemical composition of the film formed on lithium in nonaqueous aprotic liquid electrolytes are reviewed by Dominey [7], SEI formation on carbon and graphite anodes in liquid electrolytes has been reviewed by Dahn et al. [8], In addition to the evolution of new systems, new techniques have recently been adapted to the study of the electrode surface and the chemical and physical properties of the SEI. The most important of these are X-ray photoelectron spectroscopy (XPS), SEM, X-ray diffraction (XRD), Raman spectroscopy, scanning tunneling microscopy (STM), energy-dispersive X-ray spectroscopy (EDS), FTIR, NMR, EPR, calorimetry, DSC, TGA, use of quartz-crystal microbalance (QCMB) and atomic force microscopy (AFM). 

Surface morphology Reflection high-energy electron diffraction (RHEED) Atomic force microscopy (AFM)... 

Why are typical surface science techniques such as low-energy electron diffraction, scanning tunneling and atomic force microscopy generally unsuitable for studying supported catalysts ... 

The experimental tools for this research were chronopotetiometry (galvanostatic cycling),25 atomic force microscopy (AFM),26,27 scanning electron microscopy (SEM), and X-ray diffraction (XRD).21,25 It should be mentioned that the AFM imaging was conducted in-situ under potential control and in a special homemade glove box filled with highly pure argon atmosphere. This system has been already described in detail in the literature.28... 

Stolz, M., Stoffler, D., Aebi, U., and Goldsbury, C. (2000). Monitoring biomolecular interactions by time-lapse atomic force microscopy. / Struct. Biol. 131, 171-180. Sunde, M., Serpell, L. C., Bartlam, M., Fraser, P. E., Pepys, M. B., and Blake, C. C. (1997). Common core structure of amyloid fibrils by synchrotron X-ray diffraction. / Mol. Biol. 273, 729-739. 

During investigations we were analyzing samples by methods of X-ray diffraction, electron scanning microscopy, microprobe analysis, atomic force microscopy, high-resolution transmission electron microscopy with preliminary attracting of the another methods including optical microscopy, Raman spectroscopy, thermal analysis and some of others. 

Mechanistic investigations of gas-solid and solid-solid reactions as well as their proper engineering require identifiable crystal surfaces for atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) [1,3, 13-15] in combination with X-ray diffraction data, which are the basis of crystal packing analyses [1,3,16-18]. 

In a recent communication [91], Ni surface alloyed with Cu, Ti, or Cu + Ti by ion implantation was examined for its redox and electrocatalytic activities by cyclic voltammetry. The surface was characterized by XPS, x-ray, and electron diffraction, as well as by electron and atomic force microscopies. This type of material exhibited a unique voltammetric response of Ni and was shown to stabilize the / -modification of the Ni oxide/hydroxide. It was demonstrated that the morphology and microstructure differ from those of bulk materials. 

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