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Depth profiling damage effects

Even if all possible measures to improve depth resolution are applied, there still exist the effects of the primary ion beam-induced damage experienced by the substrate as a result of the sputtering process. These are discussed in Section 5.3.2.4.1. Crater edge effects and crater base effects can also result in the loss of depth resolution. These are discussed in Sections 5.3.2.4.2 and 5.3.2.4.3, respectively. Dynamic range pertains to the range of concentrations of a specific element or molecule that can be examined in a particular depth profile. As can be envisaged, this depends on the detection limit and on the detector type or combinations thereof (detectors are covered in Section 4.2.3.3). [Pg.237]

A diagnosis of possible damage should be made before beginning repairs with other construction measures [48,49]. There should be a checklist [48] of the important corrosion parameters and the types of corrosion effects to be expected. Of special importance are investigations of the quality of the concrete (strength, type of cement, water/cement ratio, cement content), the depth of carbonization, concentration profile of chloride ions, moisture distribution, and the situation regarding cracks and displacements. The extent of corrosion attack is determined visually. Later the likelihood of corrosion can be assessed using the above data. [Pg.432]

Implantable microelectronic devices for neural prosthesis require stimulation electrodes to have minimal electrochemical damage to tissue or nerve from chronic stimulation. Since most electrochemical reactions at the stimulation electrode surface alter the hydrogen ion concentration, one can expect a stimulus-induced pH shift [17]. When translated into a biological environment, these pH shifts could potentially have detrimental effects on the surrounding neural tissue and implant function. Measuring depth and spatial profiles of pH changes is important for the development of neural prostheses and safe stimulation protocols. [Pg.307]

In subsequent experiments, Biersack, et al. (29) used the boron (n,alpha) reaction to show the effect of pre- and post-irradiation damage on boron implantation profiles. By post-irradiating a boron implant in silicon with 200 keV H2, a migration of the boron to the Induced damage sites was observed. In the same paper, diffusion and trapping of lithium ions in niobium were reported. Using the lithium (n,alpha) reaction, they mapped irradiation Induced crystal defects through a depth of several micrometers with respect to several sample treatment conditions. [Pg.169]

The purpose of the detailed survey is to ensure a cost-effective repair in line with the client s requirements. This is done by accurately defining and measuring the cause, extent and severity of deterioration. In Chapter 7, we will discuss how test measurements may be used to model the deterioration rate, time to corrosion and life cycle costing. We will need to know how much damage has been done and what has caused the damage. Quantities for repair tenders will probably be based on the results of this survey, so a full survey of all affected elements may be required. Alternatively a full visual survey may be required, with a hammer (delamination) survey of all accessible locations. A number of representative areas may be selected for a detailed survey of cover depths, carbonation depths, chloride content or profile, half cell potentials and other techniques described in the following sections of this chapter. [Pg.33]


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See also in sourсe #XX -- [ Pg.679 ]




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DEPTH effect

Damage depth

Damage effect

Damage profiles

Depth profiles

Effective profile

Profile Effects

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