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Oxide Deposition

Oxidation first produces soluble oxygenated compounds of molecular weights between 500 and 3000 that increase the viscosity of oil then they polymerize, precipitate, and form deposits. Oxidation also causes formation of low molecular weight organic acids which are very corrosive to metals. [Pg.358]

In the microelectronics industry, powdered metals and insulating materials that consist of noimoble metals and oxides are deposited by screen printing in order to form coatings with high resistivities and low temperature coefficients of resistance. This technique may be useful in depositing oxide—metal refractory coatings. [Pg.46]

Photoseni bilization - induced formation of singlet oxygen on the surface of deposited oxides of transition metals... [Pg.391]

The formation of singlet oxygen through the Kautsky mechanism [78] was observed not only when sensibilization was induced by adsorbed dye molecules but also in case when sensibilization was provided by deposited oxides of transition metals [92, 93]. This is very important for understanding numerous heterogeneous and photocatalytic processes. [Pg.391]

The studies dealing with opportunity of photosensibilized formation of 02 from the surface of deposited oxides were studied in a vial similar to that described in [24]. The identification of C>2 was provided by similar techniques. The evaluation of concentration of C>2 molecules in gaseous phase involved the assessment of oxidation rate of 1,3-diphenil-benzofurane in hexadecane. It occurred that in this case the concentration of 02 molecules amounts to 10 cm. ... [Pg.391]

M.V. Yakunichev, Photostimulated Emission of Singlet Oxygen from the Surface of Deposited Oxides of Transit Metals (Photocatalysts), PhD Thesis, Moscow, 1986 (in Russian)... [Pg.400]

Most of the oxide copper deposits are located in the former Republic of Zaire (Katanga) and Zambia. Only a few deposits are located in Chile, Peru, Canada and the United States. From most of the south and North American deposits, oxide copper is recovered using a hydrometallurgical method. [Pg.48]

Electrochemical properties of silicon single crystals, usually cuts of semiconductor wafers, have to be considered under two distinct respects (1) As an electrode, silicon is a source of charge carriers, electrons or positive holes, involved in electrochemical reactions, and whose surface concentration is a determining parameter for the rate of charge transfer. (2) As a chemical element, silicon material is also involved in redox transformations such as electroless deposition, oxide generation, and anodic etching, or corrosion processes. [Pg.308]

Another method used to deposit oxides, particularly those with a higher oxidation state than the starting cation, uses persulphate, S2O8, a strong oxidizing agent. While the exact mechanism of oxide formation using persulphate is unclear, it appears to involve internal electrochemical reactions e.g., for PbOz ... [Pg.46]

However, it is possible that free radicals, snch as - OH, are involved, since persulphate hydrolysis can proceed with formation of H2O2, which is itself sometimes used to deposit oxides ... [Pg.46]

Since Si02 substrates appear frequently during IC fabrication, the adhesion test results for this substrate are important. Four types of oxides have been extensively tested. They are (1) thermal oxide grown at 7>1000°C, (2) softer oxide processed by conventional spin-on-glass technology, (3) phosphorus-doped LPCVD oxide, and (4) low-temperature (200°C) plasma deposited oxide. [Pg.453]

Not blue but borderline between violet and blue green it appears more like a mixture between violet red and blue green and overall looks greyish. NOTE Above chart may also be used for Vapox, Silox, and other deposited oxide films. For silicon nitride films, multiply film thickness by 0.75. [Pg.178]

Transient photoconductivity measurements of the depletion width, as described in Section 9.1.3, show that there is an electron accumulation layer at the interface with SijN4 (Street et al. 1985b). In contrast, an oxide interface (either a native or deposited oxide) has a depletion layer (Aker, Peng, Cai and Fritzsche 1983). The band bending causes similar changes in the conductance of the films as is described for adsorbed molecules in Section 9.2.2. [Pg.344]

Therefore the formation of magnetite in that way could hardly be of essential importance in the metamorphism of iron-formations, and martitiza-tion is still less hkely. However, in deposits of other genetic types, for instance skam deposits, oxidation of iron silicates to magnetite at the contact with large masses of carbonate rocks (dolomite, magnesite) can be considered an ore-forming process. The last conclusion is still feasible because the carbon dioxide released in the dissociation of carbonates probably had an undisturbed CO O2 ratio. [Pg.220]


See other pages where Oxide Deposition is mentioned: [Pg.80]    [Pg.458]    [Pg.372]    [Pg.15]    [Pg.284]    [Pg.240]    [Pg.136]    [Pg.82]    [Pg.23]    [Pg.113]    [Pg.116]    [Pg.124]    [Pg.9]    [Pg.104]    [Pg.157]    [Pg.188]    [Pg.138]    [Pg.75]    [Pg.107]    [Pg.712]    [Pg.542]    [Pg.241]    [Pg.316]    [Pg.495]    [Pg.352]    [Pg.35]    [Pg.337]    [Pg.182]    [Pg.153]    [Pg.62]    [Pg.4]    [Pg.350]    [Pg.253]   
See also in sourсe #XX -- [ Pg.285 , Pg.287 ]




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