Ceramics depth profiles

If the rf source is applied to the analysis of conducting bulk samples its figures of merit are very similar to those of the dc source [4.208]. This is also shown by comparative depth-profile analyses of commercial coatings an steel [4.209, 4.210]. The capability of the rf source is, however, unsurpassed in the analysis of poorly or nonconducting materials, e.g. anodic alumina films [4.211], chemical vapor deposition (CVD)-coated tool steels [4.212], composite materials such as ceramic coated steel [4.213], coated glass surfaces [4.214], and polymer coatings [4.209, 4.215, 4.216]. These coatings are used for automotive body parts and consist of a number of distinct polymer layers on a metallic substrate. The total thickness of the paint layers is typically more than 100 pm. An example of a quantitative depth profile on prepainted metal-coated steel is shown as in Fig. 4.39. 

Fig. 4.52. SIMS and IBSCA depth profiles of the altered layer region of a lithium aluminosilicate (LAS) glass ceramic (conditions SkeVAr" ).

Data treatment, tin and lead concentrations in majolica pottery production, 383-384 Defixiones. See Curse tablets Deh Luran Plain, ceramic glaze samples for compositional analysis, 424-427,434,436 137,440 Depth profiling, coating samples from Little Lost River Cave, 162-163 Detection limits in LA-ICP-MS protocol testing copper alloy analysis, 341 Wari ceramics elemental analysis, 353-354/... 

The power of laser ablation can be extended as a popular method for trace and bulk analysis in conjunction with ICP-OES and is an invaluable tool in the study of surface behaviour particularly where sensitive surfaces are important. The common area for surface knowledge is in environment, medicines, adhesives, powders, slurries, oil-based samples and liquids. It finds application in the analysis of metallurgical samples, non-conductive polymers, ceramic materials, surface mapping, elemental migration, depth profiling, thin film coatings, biological and clinical specimens, forensic, paint chips, inks, bullets, fabrics, etc. 

P. Fielitz, G. Borchardt, M. Schmuecker, H. Schneider, and P. Willich, Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling, Appl. Surf. Sci. 203-204, 639-643 (2003). 

Arita M, Hosoya M, Kobayashi M, Someno M (1979) Depth profile measurement by secondary ion mass spectrometry for determining the tracer diffusivity of oxygen in rutile. J Am Ceram Soc 62 443-446 Bagshaw AN, Hyde, BG (1976) Oxygen tracer diffusion in the magneli phases Tin02n-i J Phys Chem Solids 37 835-838... 

The very favorable features of electron gas SNMS for high-resolution depth profiling being achieved with the DBM technique (see above) become exemplified by Figure 16. This figure shows the depth profile through a W-Si multilayer stack on a ceramic... 

For the depth profiling of a metal, of particulate matter, or a ceramic with a resolution of a few nanometers, sputtered neutral mass spectrometry (SNMS) (2511 is the best choice since the sputter-... 

Depth concentration measurement is an important application of surface analytical methods. Examples are depth distribution of additives in plastics, or interface analysis where polymers are in contact with metals or ceramics. All surface methods with a good depth resolution (XPS, AES, SIMS) are suitable for depth or profile measurements. Complete multilayer coating systems require analytical methods that are applicable to small sample sizes and low concentrations. Techniques for obtaining chemical composition and component distribution depth profiles for automotive coating systems, both in-plane (or slab) microtomy and cross-section microtomy, include /xETIR, /xRS, ToE-SIMS, optical microscopy, TEM, as well as solvent extraction followed by HPLC, as illustrated by Adamsons et al. [5]. Surface and interface/interphase analysis can now be done routinely on both simple monolayer coatings and complex multicomponent, multilayered... 

It is worthwhile, however, emphasizing the extensive work that has been carried out with ISS on ceramic surface sites [I3.I4[. The review by Brongersma et al. 114 summarizes studies of composition, structure, diffusion, segregation, growth, adsorption, desorption, depth profiling, spunering. neutralization, an-... 

Examples of SSIMS depth profiles obtained from ceramics and glasses have been discussed (c.g.. Fig. 19) [104.107]. Examples of XPS depth profiles obtained from similar titanate fracture surfaces are shown in Fig. 21 ] 104]. An enhancement of Cs, A1 and. to a minor extent. Ca and Mo on the fresh fracture face, and to a depth of approximately 5 nm, is inferred from these profiles. Exposure to water removes the surface enhancement. 

Figure 19. SSIMS depth profile of a fresh fracture face of the ceramic syn-roc C, demonstrating enhancement of Cs and Na, but not Ca and Ti. in the intergranular region [104,1071.

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