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Beam steering

This paper intends to give, through different examples, guide-lines for characterization of array probes. We discuss, particularly, beam pattern measurement methods and raise the question whether it is useful to achieve a full characterization of all beams steered by the probe or to limit the characterization to a minimum set of acoustic configurations. An automatic bench for full characterization of tube inspection probes is described. [Pg.819]

Auger analysis of small features. The primary electron beam column is similar to that in electron microscopes, and it may contain both electrostatic and magnetic lenses for beam focussing as well as quadrupole deflectors for beam steering and octopole lenses for beam shaping. [Pg.170]

IEEE Article No 602864, Automatic Beam Steered Antenna Receiver-Microwave. [Pg.291]

Active transmitler wiih laser diode and beam steering... [Pg.226]

Figure 15.5 Schematic of instrumental apparatus. The DT/MH-functionalized AgFON was surgically implanted into a rat with an optical window and integrated into a conventional laboratory Raman spectroscopy system. The Raman spectroscopy system consists of a Ti sapphire laser (Acx = 785 nm), band-pass filter, beam-steering optics, collection optics, and a long-pass filterto reject Raleigh scattered light. All of the optics fit on a 4 ft x 10 ft optical table. Figure 15.5 Schematic of instrumental apparatus. The DT/MH-functionalized AgFON was surgically implanted into a rat with an optical window and integrated into a conventional laboratory Raman spectroscopy system. The Raman spectroscopy system consists of a Ti sapphire laser (Acx = 785 nm), band-pass filter, beam-steering optics, collection optics, and a long-pass filterto reject Raleigh scattered light. All of the optics fit on a 4 ft x 10 ft optical table.
Active-steered communication systems include a small laser diode, a collimating lens and beam-steering optics. [Pg.189]

Fig. 40. Schematic representation of our electro-optic polymer beam steering device with a demonstration of its performance... Fig. 40. Schematic representation of our electro-optic polymer beam steering device with a demonstration of its performance...
Figure 4. Experimental arrangement for multichannel-detected CD. So, 30 W deuterium lamp source P, beam steering prism Lj, L2, beam focusing, collimating lenses M,... Figure 4. Experimental arrangement for multichannel-detected CD. So, 30 W deuterium lamp source P, beam steering prism Lj, L2, beam focusing, collimating lenses M,...
Figure 10. Optical configuration for differentially arranged, thermal lens detected CD. P, beam steering prism M, beam steering mirror BS, polarizing beam splitter HR, half-wave rhomb QR, quarter-wave rhomb L, focusing lens DM, dichroic mirror C, converging sample cell (before probe focus) D, diverging sample cell (after probe focus) PD, aperture/photodiode combination LF, line filter (to isolate the probe laser from extraneous pump radiation). Solid line, probe laser optical path broken line, pump beam path. Figure 10. Optical configuration for differentially arranged, thermal lens detected CD. P, beam steering prism M, beam steering mirror BS, polarizing beam splitter HR, half-wave rhomb QR, quarter-wave rhomb L, focusing lens DM, dichroic mirror C, converging sample cell (before probe focus) D, diverging sample cell (after probe focus) PD, aperture/photodiode combination LF, line filter (to isolate the probe laser from extraneous pump radiation). Solid line, probe laser optical path broken line, pump beam path.
This design also utilized two sets of beam steering plates. One set, labeled D1 and D2 in Fig. 12.9, constitute a pair of deflection plates employed to remove Ar+ from the extracted ion packets. A 230-V pulse of variable duration delayed from the repeller pulse eliminated more than 99% of these ions and prevented detector saturation. [Pg.475]

Pattern exposure a pattern is generated by a mask or controlled radiation-beam steering, where the exposed material is degraded, chemically modified or crosslinked. [Pg.424]

Impact of Beam Steering Errors on Device Performance... [Pg.232]

Fig. 15.13. On current of a 65 nm node NMOS transistor versus beam steering angle. A positive angle corresponds to shadowing of the extension region on the drain side, while a negative angle corresponds to shadowing on the source side. The curve is not symmetric since the resistivity of the source side is far more important than the resistivity of the drain side (Ghani et al. 2001)... Fig. 15.13. On current of a 65 nm node NMOS transistor versus beam steering angle. A positive angle corresponds to shadowing of the extension region on the drain side, while a negative angle corresponds to shadowing on the source side. The curve is not symmetric since the resistivity of the source side is far more important than the resistivity of the drain side (Ghani et al. 2001)...
Fig. 15.14. On current of the same NMOS transistor as in Fig. 15.13 as a function of tilt angle for a beam steering angle of -1°, for a single implant (triangles) and for a quad implant (squares). The line indicates 7on for perfect alignment... Fig. 15.14. On current of the same NMOS transistor as in Fig. 15.13 as a function of tilt angle for a beam steering angle of -1°, for a single implant (triangles) and for a quad implant (squares). The line indicates 7on for perfect alignment...

See other pages where Beam steering is mentioned: [Pg.722]    [Pg.134]    [Pg.119]    [Pg.428]    [Pg.226]    [Pg.250]    [Pg.249]    [Pg.252]    [Pg.136]    [Pg.148]    [Pg.148]    [Pg.364]    [Pg.66]    [Pg.69]    [Pg.296]    [Pg.197]    [Pg.235]    [Pg.1562]    [Pg.206]    [Pg.232]    [Pg.232]    [Pg.140]    [Pg.36]    [Pg.315]    [Pg.64]    [Pg.37]    [Pg.196]    [Pg.72]    [Pg.232]    [Pg.232]   
See also in sourсe #XX -- [ Pg.250 ]

See also in sourсe #XX -- [ Pg.11 , Pg.25 ]




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Steer

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