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Auger measurements

Experimentally, it is common for LEED and Auger capabilities to be combined the basic equipment is the same. For Auger measurements, a grazing angle of incident electrons is needed to maximize the contribution of surface... [Pg.306]

Compensation of Preferential Sputtering. The species with the lower sputter yield is enriched at the surface. This effect is called preferential sputtering and complicates, e. g.. Auger measurements. The enrichment compensates for the different sputter yields of the compound or alloy elements thus in dynamic SIMS (and other dynamic techniques in which the signal is derived from the sputtered particles, e.g. SNMS, GD-MS, and GD-OES), the flux of sputtered atoms has the same composition as the sample. [Pg.106]

Herb Uhlig was the advisor and intellectual father of many U.S. scientists who are at work in numerous companies in the United States. Among the best known of his students were Milton Stern, originator of the Stern-Geary method for the measurement of corrosion, and Winston Revie, who made the first Auger measurements on passive films. [Pg.207]

Some topics have been omitted from this review. This holds for the structure and function of metal sites in metalloproteins and metalloenzymes in relation to enzymatic catalysis, for which the reader is referred to Cramer and Hodgson (68) and Doniach et al. (80). Also, chemisorption studies and the structure of adsorbate-covered surfaces are not considered in this review, which deals with XAES in transmission, thus characterizing bulk material. It is noted that even in the case of chemisorbed atoms XANES data analysis requires physically the definition of clusters of considerable size. On the other hand, the analysis is simplified for adsorbed molecules. Very pronounced near-edge effects (usually obtained by electron-stimulated Auger measurements) are observed for low-Z-atom(C, N, O, F>containing chemisorbed... [Pg.258]

As regards the SiC/Ta interface, the peak shifts (Si, C) reflect the changes in chemical environment of these elements and the existence of complex bonds in the Ta-Si-C-0 and Ta-C systems. Note that Auger measurements performed on the denuded parts of the substrate obtained during scratch tests, and on these same parts obtained during bending tests, give evidence of a failure surface made of tantalum. [Pg.74]

Auger measurements tend to be faster than equivalent FEGSTEM/EDX analyses, but there remain fundamental issues with the examination of the surfaces. These include the possibilities that ... [Pg.252]

APS Appearance potential spectroscopy (see AES) Intensity of emitted x-ray or Auger electrons is measured as a function of incident electron energy Surface composition... [Pg.316]

Mobility of this second kind is illustrated in Fig. XVIII-14, which shows NO molecules diffusing around on terraces with intervals of being trapped at steps. Surface diffusion can be seen in field emission microscopy (FEM) and can be measured by observing the growth rate of patches or fluctuations in emission from a small area [136,138] (see Section V111-2C), field ion microscopy [138], Auger and work function measurements, and laser-induced desorption... [Pg.709]

Figure Al.7.12. Secondary electron kinetic energy distribution, obtained by measuring the scadered electrons produced by bombardment of Al(lOO) with a 170 eV electron beam. The spectrum shows the elastic peak, loss features due to the excitation of plasmons, a signal due to the emission of Al LMM Auger electrons and the inelastic tail. The exact position of the cutoff at 0 eV depends on die surface work fimction. Figure Al.7.12. Secondary electron kinetic energy distribution, obtained by measuring the scadered electrons produced by bombardment of Al(lOO) with a 170 eV electron beam. The spectrum shows the elastic peak, loss features due to the excitation of plasmons, a signal due to the emission of Al LMM Auger electrons and the inelastic tail. The exact position of the cutoff at 0 eV depends on die surface work fimction.
The strong point of AES is that it provides a quick measurement of elements in the surface region of conducting samples. For elements having Auger electrons with energies hr the range of 100-300 eV where the mean free path of the electrons is close to its minimum, AES is considerably more surface sensitive than XPS. [Pg.1859]

If monochromatic X-rays are used as the ionizing radiation the experimental technique is very similar to that for XPS (Section 8.1.1) except that it is the kinetic energy of the Auger electrons which is to be measured. Alternatively, a monochromatic electron beam may be used to eject an electron. The energy E of an electron in such a beam is given by... [Pg.317]

Natural Deposits. Natural deposits, eg, minerals and fossil fuels, are located by drilling operations. An auger, eg, a screw or worm, is turned in the earth and pulled out, and material is scraped from the auger for analysis. Alternatively, samples can be taken by hoUow core drills which, when withdrawn, enclose a core of the earth that is representative of the strata through which the drill has passed. Such core samples are used in geological surveys for fossil fuels. As the drill drives deeper into the strata, each core is extracted and placed in a shallow box and coded so that a complete cross section of the geological strata can be reconstmcted. From this, the relative thickness of coal and mineral seams can be directly measured. [Pg.305]


See other pages where Auger measurements is mentioned: [Pg.256]    [Pg.14]    [Pg.356]    [Pg.331]    [Pg.158]    [Pg.220]    [Pg.333]    [Pg.167]    [Pg.382]    [Pg.110]    [Pg.60]    [Pg.437]    [Pg.446]    [Pg.284]    [Pg.150]    [Pg.355]    [Pg.256]    [Pg.14]    [Pg.356]    [Pg.331]    [Pg.158]    [Pg.220]    [Pg.333]    [Pg.167]    [Pg.382]    [Pg.110]    [Pg.60]    [Pg.437]    [Pg.446]    [Pg.284]    [Pg.150]    [Pg.355]    [Pg.306]    [Pg.306]    [Pg.307]    [Pg.308]    [Pg.1807]    [Pg.1822]    [Pg.1842]    [Pg.1859]    [Pg.1859]    [Pg.2749]    [Pg.403]    [Pg.445]    [Pg.314]    [Pg.526]    [Pg.331]    [Pg.3]    [Pg.144]   


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Auger

Auger electrons measured in coincidence with the photoelectron

Auger measurements electron-stimulated

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