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Field emission microscopy, FEM

Mobility of this second kind is illustrated in Fig. XVIII-14, which shows NO molecules diffusing around on terraces with intervals of being trapped at steps. Surface diffusion can be seen in field emission microscopy (FEM) and can be measured by observing the growth rate of patches or fluctuations in emission from a small area [136,138] (see Section V111-2C), field ion microscopy [138], Auger and work function measurements, and laser-induced desorption... [Pg.709]

Energy Dispersive X-Ray Analysis (EDX, EDAX) Field Emission Microscopy (FEM)... [Pg.182]

Field emission devices, 17 49-50 Field emission FPDs (FEDs), 22 259 Field emission microscope (FEM), 16 503 Field emission microscopy (FEM), 24 74 Field emission scanning electron microscope (FESEM), 16 492 Field emission scanning electron... [Pg.356]

Less generally applicable than electron or scanning probe microscopy - but still capable of revealing great detail - are field emission microscopy (FEM) and field ion microscopy (FIM). These techniques are limited to the investigation of sharp metallic tips, however, with the attractive feature that the facets of such tips exhibit a variety of crystallographically different surface orientations, which can be studied simultaneously, for example in gas adsorption and reaction studies. [Pg.180]

A variety of model catalysts have been employed we start with the simplest. Single-crystal surfaces of noble metals (platinum, rhodium, palladium, etc.) or oxides are structurally the best defined and the most homogeneous substrates, and the structural definition is beneficial both to experimentalists and theorists. Low-energy electron diffraction (LEED) facilitated the discovery of the relaxation and reconstruction of clean surfaces and the formation of ordered overlayers of adsorbed molecules (3,28-32). The combined application of LEED, Auger electron spectroscopy (AES), temperature-programmed desorption (TPD), field emission microscopy (FEM), X-ray and UV-photoelectron spectroscopy (XPS, UPS), IR reflection... [Pg.137]

Field emission microscopy (FEM) - See Techniques for Materials Characterization, page 12-1. [Pg.104]

The work that has to be done to remove an electron from a metal into vacuum with zero kinetic energy at zero K is termed the work function, and this is the same as the ionisation potential, but is larger than that of the free atom because of the space charge or surface dipole that exists at the surface, due to the asymmetry of electron density. Work function is greatest at planes having a high concentration of atoms (i.e. generally low-index planes), and decreases with step density at stepped surfaces. Variation of work function with crystal plane underlies the technique of Field-Emission Microscopy (FEM). [Pg.22]

Using field-emission microscopy (FEM) to observe axial rotation and preferential adsorption of dimeric C2 units during growth Marchand, M. Joumet, C. Guillot, D. Benoit, J. -M. Yakobson, B. [Pg.579]

An example of field emission microscopy (FEM) images of the oscillating CO oxidation reaction is given in Fig. 9.34. [Pg.545]


See other pages where Field emission microscopy, FEM is mentioned: [Pg.26]    [Pg.142]    [Pg.43]    [Pg.86]    [Pg.193]    [Pg.34]    [Pg.94]    [Pg.105]    [Pg.909]    [Pg.920]    [Pg.909]    [Pg.920]    [Pg.109]   
See also in sourсe #XX -- [ Pg.299 , Pg.313 ]




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