Applications of XRF and PIXE Techniques

Applications of XRF and PIXE Techniques 85 1.12.6 For Chemical Analysis of Samples... 

Different analytical procedures have been developed for direct atomic spectrometry of solids applicable to inorganic and organic materials in the form of powders, granulate, fibres, foils or sheets. For sample introduction without prior dissolution, a sample can also be suspended in a suitable solvent. Slurry techniques have not been used in relation to polymer/additive analysis. The required amount of sample taken for analysis typically ranges from 0.1 to 10 mg for analyte concentrations in the ppm and ppb range. In direct solid sampling method development, the mass of sample to be used is determined by the sensitivity of the available analytical lines. Physical methods are direct and relative instrumental methods, subjected to matrix-dependent physical and nonspectral interferences. Standard reference samples may be used to compensate for systematic errors. The minimum difficulties cause INAA, SNMS, XRF (for thin samples), TXRF and PIXE. 

Until now, little attention has been given to the analysis of ancient copper alloys with LA-ICP-MS. This type of material is usually analyzed with fast or instrumental neutron activation analysis (FNAA or INAA), particle induced X-ray emission (PIXE), X-ray fluorescence (XRF), inductively coupled plasma-atomic emission spectrometry or inductively coupled plasma-atomic absorption spectrometry (ICP-AES or ICP-AAS). Some of these techniques are destructive and involve extensive sample preparation, some measure only surface compositions, and some require access to a cyclotron or a reactor. LA-ICP-MS is riot affected by any of these inconveniences. We propose here an analytical protocol for copper alloys using LA-ICP-MS and present its application to the study of Matisse bronze sculptures. 

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