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Angular pattern

Unlike the wave function, the electron density can be experimentally determined via X-ray diffraction because X-rays are scattered by electrons. A diffraction experiment yields an angular pattern of scattered X-ray beam intensities from which structure factors can be obtained after careful data processing. The structure factors F(H), where H are indices denoting a particular scattering direction, are the Fourier transform of the unit cell electron density. Therefore we can obtain p(r) experimentally via ... [Pg.143]

Although the probability of absorption of TIR evanescent energy by a fluorophore of given orientation decreases exponentially with distance z from a dielectric surface, the intensity of the fluorescence actually viewed by a detector varies with z in a much more complicated fashion. Both the angular pattern of the emitted radiation and the fluorescent lifetime are altered as a function of z by the proximity of the surface. [Pg.298]

The ground state behaviour observed for Jahn-Teller impurities in cubic lattices has often been explained a posteriori by fitting experimental data to quantities like the average random strains, the Jahn-Teller energy, E]T, or the % frequency [5]. In particular when EJT/iuov < 1 the observation at low temperatures of a cubic angular pattern is favoured, while if E /Hcoe > 1 a static EPR spectrum is expected [1-3]. [Pg.447]

Therefore, this value of V found for MgO Cu2+ is practically the same as that obtained for NaCl Rh2+. The big difference between K = 4.5 eV/A2 for NaCl Rh2+ and K = 14 eV/A2 for MgO Cu2+ is thus the main responsible for the small values of oq = — 0.023 A and En = 0.035 eV found in the latter case. It is worth noting that present calculations lead in fact to a ratio En /tuoH = 0.65 which favours the observation of low temperature EPR spectra displaying cubic angular pattern [4], This value is thus more reasonable than the ratio ETT/ha>E= 40 previously estimated by Reynolds et al. [5]. Moreover the sb — sa separation at equilibrium is just given by... [Pg.456]

The angular pattern observed for the 5/5 bicyclic (III) may be interpreted to a good approximation as an incipient pseudorotation (15% transition) to the eae con-... [Pg.35]

The diffraction maxima in the wide-angle diffraction pattern derive from the periodicity of the crystal lattice (Cullity and Stock 2001). Their angular pattern is characteristic of the crystal lattice, so is ideal for identification and detection purposes. For monochromatic radiation (X-rays, neutrons or electrons) of wavelength X, Bragg s Law gives... [Pg.432]

Fig. 4.30 CDAD asymmetry for oxygen adsorbed on Nd top), Tb middle), and Gd bottom) after an exposure of 1 L ( v = 30 eV). For small emission angles, the asymmetry for 0/Gd(0001) is very different as compared to 0/Nd(0001) and 0/Tb(0001). The dotted line corresponds to sin20, the angular pattern expected for an aligned p state in isotropic space. The full line is to guide the eye. The error amounts to about 5%. Reprinted from [40], Copyright (1996), with permission from Elsevier... Fig. 4.30 CDAD asymmetry for oxygen adsorbed on Nd top), Tb middle), and Gd bottom) after an exposure of 1 L ( v = 30 eV). For small emission angles, the asymmetry for 0/Gd(0001) is very different as compared to 0/Nd(0001) and 0/Tb(0001). The dotted line corresponds to sin20, the angular pattern expected for an aligned p state in isotropic space. The full line is to guide the eye. The error amounts to about 5%. Reprinted from [40], Copyright (1996), with permission from Elsevier...
Further increase in particle size results in the development of minima and maxima in the angular pattern — a kind of particle size fingeiprint This is due to interference which causes waves in some parts of the particle to be out of phase, giving intensity minima, while those from other parts are in phase and so give intensity maxima. This is the basis of the maximum-mimnum technique of particle size measurement The scattering envelope is illustrated in Figure 12.5. [Pg.215]

It follows, that a characteristic diffraction pattern is obtained, when the scattered radiation intensity is measured as a function of 0. Actually, a well-defined angular pattern is indicative of a medium of high orderliness, and in this case the term diffraction is commonly used instead of scattering. [Pg.335]


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See also in sourсe #XX -- [ Pg.66 , Pg.94 , Pg.115 , Pg.151 , Pg.174 , Pg.242 ]




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Angular correlation patterns

Scattering angular pattern

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