A sample configuration

Figure 3. Simulated icflectivity-versus-incidait angle 6 (ai ular) scans (R(6) fidl curves) for a sample configuration consisting of prism / Ag layer / H O (a), prism / An layer / H2O (b) and a mete dielectric interfiux prism / H2O (TIR). The dotted curves ate dw corresponding optical intensities (scaled to the incraning laser intensity L) at the metal / H2O attd glass / H2O intetfiice, respectively.

Broadband dielectric spectroscopy has been utilized in many forms to study the dynamics of polymers under strong states of confinement. These include all the major modes of confinement discussed previously, including thin film, nano-porous, nanofiUer, and nanosUucture confinements. This is a testament to the utility of broadband dielectric spectroscopy. It is relatively straightforward to design a sample configuration... 

This method needs a highly specialized sample configuration and the sample has to be a very sharp point... 

MD, one needs to use multiple time step methods to ensure proper handling of the sprmg vibrations, and there is a possible physical bottleneck in the transfer of energy between the spring system and the other degrees of freedom which must be handled properly [199]. In MC, one needs to use special methods to sample configuration space efficiently [200, 201]. 

Simulations need a substantial number of timesteps to sample configurational states such that desired properties are represented well enough to either con —100 ps. For systems of >100 atoms, mn for 500—2,000 ps if computing resources permit. 

In research environments where the configuration and activity level of a sample can be made to conform to the desires of the experimenter, it is now possible to measure the energies of many y-rays to 0.01 keV and their emission rates to an uncertainty of about 0.5%. As the measurement conditions vary from the optimum, the uncertainty of the measured value increases. In most cases where the counting rate is high enough to allow collection of sufficient counts in the spectmm, the y-ray energies can stih be deterrnined to about 0.5 keV. If the configuration of the sample is not one for which the detector efficiency has been direcdy measured, however, the uncertainty in the y-ray emission rate may increase to 5 or 10%. 

Fig. 4. (a) Type-S pitot tube and thermocouple (b) side view of the correct pitot tube configuration when used ia conjunction with a sampling nozzle, where A is the static pressure opening plane and B is the impact pressure opening plane and (c) bottom view. 

A variety of commercial instruments are available for PL measurements. These include spectrofluorometers intended primarily for use with liquids in a standard configuration, and simple filter-based systems for monitoring PL at a single wavelength. For use with opaque samples and surfaces, a few complete commercial systems are available or may be appropriately modified with special attachments, but due to the wide range of possible configuration requirements it is common to assemble a custom system from commercial optical components. 

From a constitutive relation of the form t = t(D, ri) (here t is stress not time) it can be readily shown that, since there is no change in electric displacement in an open-circuit, thick-sample configuration, there are no secondary stresses due to electromechanical coupling. Nevertheless, the wavespeed is that of a piezoelectrically stiffened wave. 

Resistivity. Control of the resistivity of the mud and mud filtrate while drilling may be desirable to permit better evaluation of formation characteristics from electric logs. The determination of resistivity is essentially the measurement of the resistance to electrical current flow through a known sample configuration. Measured resistance is converted to resistivity by use of a cell constant. The cell constant is fixed by the configuration of the sample in the cell and is determined by calibration with standard solutions of known resistivity. The resistivity is expressed in ohm-meters. 

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