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Voltage parameters

We are calling the new model My. Note that the symbols for enhancement- and depletion-mode MOSFETs are the same. PSpice knows that a MOSFET is either an enhancement- or a depletion-mode MOSFET by the value of the threshold voltage parameter, VtO. [Pg.224]

Equation 18.2 shows that conductance is the reciprocal of resistance and can be found by dividing the current by the voltage, parameters that can be easily monitored and recorded... [Pg.546]

Figure 3.19 Experimentally determined intensity change due to a 0.03% drift in tube voltage. Parameters are related to Eq. (3.12) via Ek, = 0 dl/I = dlj/Ij. (Reprinted by courtesy of EG G ORTEC.)... Figure 3.19 Experimentally determined intensity change due to a 0.03% drift in tube voltage. Parameters are related to Eq. (3.12) via Ek, = 0 dl/I = dlj/Ij. (Reprinted by courtesy of EG G ORTEC.)...
Fig. 1 The view of the polar display with monitors arcs and control panel for SFT6000N board parameters. Recorded signal is from the eddy current probe moved along in a brass tube of inner diameter 20 mm with 2 mm holes as artificial flaws. SFT6000N card operates with 40 kHz injection voltage firequency. Fig. 1 The view of the polar display with monitors arcs and control panel for SFT6000N board parameters. Recorded signal is from the eddy current probe moved along in a brass tube of inner diameter 20 mm with 2 mm holes as artificial flaws. SFT6000N card operates with 40 kHz injection voltage firequency.
The sensitivity of the luminescence IP s in the systems employed here decreases with increasing x-ray energy more strongly than in the case of x-ray film. Therefore, this phenomenon must be compensated by using thicker lead front and back screens. The specific contrast c,p [1,3] is an appropriate parameter for a comparison between IP s and film, since it may be measured independently of the spatial resolution. Since the absorption coefficient p remains roughly constant for constant tube voltage and the same material, it suffices to measure and compare the scatter ratio k. Fig. 2 shows k as a function of the front and back screen thickness for the IP s for 400 keV and different wall thicknesses. The corresponding measured scatter ratios for x-ray films with 0,1 mm front and back screens of lead are likewise shown. The equivalent value for the front and back screen thicknesses is found from the intersection of the curves for the IP s and the film value. [Pg.470]

In order to obtain the interested dependences it is necessary to fix the interconnection between the detected voltages U, Uo and the object parameters T, 1, h, the distances between tbe electrodes Rt, Rp are given (Fig. 1). [Pg.645]

Figure Bl.22.4. Differential IR absorption spectra from a metal-oxide silicon field-effect transistor (MOSFET) as a fiinction of gate voltage (or inversion layer density, n, which is the parameter reported in the figure). Clear peaks are seen in these spectra for the 0-1, 0-2 and 0-3 inter-electric-field subband transitions that develop for charge carriers when confined to a narrow (<100 A) region near the oxide-semiconductor interface. The inset shows a schematic representation of the attenuated total reflection (ATR) arrangement used in these experiments. These data provide an example of the use of ATR IR spectroscopy for the probing of electronic states in semiconductor surfaces [44]-... Figure Bl.22.4. Differential IR absorption spectra from a metal-oxide silicon field-effect transistor (MOSFET) as a fiinction of gate voltage (or inversion layer density, n, which is the parameter reported in the figure). Clear peaks are seen in these spectra for the 0-1, 0-2 and 0-3 inter-electric-field subband transitions that develop for charge carriers when confined to a narrow (<100 A) region near the oxide-semiconductor interface. The inset shows a schematic representation of the attenuated total reflection (ATR) arrangement used in these experiments. These data provide an example of the use of ATR IR spectroscopy for the probing of electronic states in semiconductor surfaces [44]-...
The two estimates for the first or a parameter of the parabolic fit are the intercepts on the voltage axis of Eig. 3-1, so both procedures arrive at a standard potential of the silver-silver chloride half-cell of 0.2225 V. The accepted modem value is 0.2223 V (Barrow, 1996). [Pg.68]

Amplifier bandwidth. The range of signal frequencies over which an amplifier is capable of undistorted or unattenuated transmission. An operational amplifier should transmit DC voltage accurately the upper (bandwidth) limit is defined as the 3-dB point (attenuation factor of two). Because bandwidth can vary with gain, the product of gain x bandwidth can be a more useful parameter. [Pg.430]

Signal conditioning. The process of altering the relationship of a transducer (ion or neutral detector) output with respect to time or other parameters (frequency, voltage, or current). [Pg.431]

This reaction has a positive free energy of 422.2 kj (100.9 kcal) at 25°C and hence energy has to be suppHed in the form of d-c electricity to drive the reaction in a net forward direction. The amount of electrical energy required for the reaction depends on electrolytic cell parameters such as current density, voltage, anode and cathode material, and the cell design. [Pg.482]

The means by which high current densities are obtained can be understood from an examination of the electrolyte conductivity and the interelectrode gap width. These parameters are related to the current through Ohm s law, which states that the current I fiowing in a conductor of resistance Ris directly proportional to the appHed voltage IN... [Pg.306]


See other pages where Voltage parameters is mentioned: [Pg.183]    [Pg.183]    [Pg.194]    [Pg.52]    [Pg.47]    [Pg.197]    [Pg.149]    [Pg.174]    [Pg.476]    [Pg.193]    [Pg.56]    [Pg.412]    [Pg.196]    [Pg.574]    [Pg.578]    [Pg.183]    [Pg.183]    [Pg.194]    [Pg.52]    [Pg.47]    [Pg.197]    [Pg.149]    [Pg.174]    [Pg.476]    [Pg.193]    [Pg.56]    [Pg.412]    [Pg.196]    [Pg.574]    [Pg.578]    [Pg.288]    [Pg.318]    [Pg.390]    [Pg.438]    [Pg.450]    [Pg.645]    [Pg.1474]    [Pg.1677]    [Pg.1677]    [Pg.1683]    [Pg.144]    [Pg.185]    [Pg.187]    [Pg.246]    [Pg.401]    [Pg.190]    [Pg.425]    [Pg.173]    [Pg.184]    [Pg.418]    [Pg.492]    [Pg.541]    [Pg.127]   


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