Trace image

To visualize the tensor, it is important that the scalar metrics do not depend on the coordinate system in which the tensor was measured (i.e., rotational invariance ). Once this is achieved, a trace image can be... 

The perimeter and area of each finite domain in the traced images is measured by Velocity. These values are used to calculate shape factors,... 

Electron Probe Microanalysis, EPMA, as performed in an electron microprobe combines EDS and WDX to give quantitative compositional analysis in the reflection mode from solid surfaces together with the morphological imaging of SEM. The spatial resolution is restricted by the interaction volume below the surface, varying from about 0.2 pm to 5 pm. Flat samples are needed for the best quantitative accuracy. Compositional mapping over a 100 x 100 micron area can be done in 15 minutes for major components Z> 11), several hours for minor components, and about 10 hours for trace elements. 

Mapping of major constituents can be carried out in approximately 15-30 minutes of scanning per image. Minor constituents require 0.5-3 hours, and trace constituents require 3-10 hours. An example of a dot map of zinc at concentrations in copper as low as 1% is shown in Figure 5 6 hours of scan time was needed to produce a dot map at this level. 

Static SIMS is labeled a trace analytical technique because of the very small volume of material (top monolayer) on which the analysis is performed. Static SIMS can also be used to perform chemical mapping by measuring characteristic molecules and fiagment ions in imaging mode. Unlike dynamic SIMS, static SIMS is not used to depth profile or to measure elemental impurities at trace levels. 

Today dynamic SIMS is a standard technique for measurement of trace elements in semiconductors, high performance materials, coatings, and minerals. The main advantages of the method are excellent sensitivity (detection limit below 1 pmol mol ) for all elements, the isotopic sensitivity, the inherent possibility of measuring depth profiles, and the capability of fast direct imaging and 3D species distribution. 

Thus by a series of calculations of ray height and position we can determine the location of an individual ray as it traverses an optical system. If we trace a series of rays all emanating from a single point on an object and discover that they all intersect at a single point we determine the image location for that point. 

Atomic force microscopy (AFM) has been used to characterize dendrimers that have been adsorbed onto a surface such as silica. AFM involves moving a finely tipped stylus across a surface and monitoring the tip movements as it traces the surface topography. In studying adsorbed dendrimers, samples can be scanned repeatedly and in a variety of directions. When this is done, it is found that all the images are the same. True dendrimers form objects of only one size. 

Time traces OH light intensity I, flame surface area A, pressure fluctuahons p, and computed pressure fluctuations kdA/dt. Circles indicate extracted flame surface areas A in cm (S and A are used indifferently to designate the flame surface). Black circles marked a, b, c, d correspond to flame patterns presented in images from Figure 5.2.3. 

Flame shape images and traces extracted from the high-speed schlieren movie (5000 frames/s) of a stoichiometric methane/air flame going through a tulip inversion while propagating in a square cross-section (38.1 mm on the side) closed tube. 

A lean methane/air flame propagating downward in a tube closed above. The tube is of 51mm diameter, (a) Self-light images of the flame (b) traces of the flame shape at 55 frames/s. (Adapted from Jarosinski, Strehlow, R.A., and Azarbarzin, A., Nineteenth Symposium (International) on Combustion, The Combustion Institute, Pittsburgh, pp. 1549-1555,1982.)... 

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