Atomic force microscopy thin

Roark S E and Rowlen K L 1993 Atomic force microscopy of thin Ag films. Relationship between morphology and optical properties Chem. Phys. Lett. 212 50... 

In this section, the thin-film formation of OPVs is investigated with optical microscopy and X-ray diffraction (XRD). In the case of Oocl-OPV5, this has been supplemented with surface imaging by means of atomic force microscopy. It is demonstrated how an annealing treatment of the films alter deposition influences... 

The lithium morphology at the beginning of the deposition was measured by in-situ atomic force microscopy (AFM) [42], When lithium was deposited at 0.6 C cm2, small particles 200-1000 nm in size were deposited on the thin lines and grain boundaries in LiC104-PC. Lump-like growth was observed in LiAsF6-PC along the line. 

The thickness of the ordered crystalline regions, termed crystallite or lamellar thickness (Lc), is an important parameter for correlations with thermodynamic and physical properties. Lc and the distribution of lamellar thicknesses can be determined by different experimental methods, including thin-section TEM mentioned earlier, atomic force microscopy, small-angle X-ray scattering and analysis of the LAM in Raman spectroscopy. 

Kanniainen, T. Lindroos, S. Prohaska, T. Friedbacher, G Leskela, M. Grasserbauer, M. Niinisto, L. 1995. Growth of zinc sulfide thin films with the successive ionic layer adsorption and reaction method as studied by atomic force microscopy./. Mater. Chem. 5 985-9. 

Atomic force microscopy (AFM) is a commonly employed imaging technique for the characterization of the topography of material surfaces. In contrast to other microscopy techniques (e.g., scanning electron microscopy), AFM provides additional quantitative surface depth information and therefore yields a 3D profile of the material surface. AFM is routinely applied for the nanoscale surface characterization of materials and has been previously applied to determine surface heterogeneity of alkylsilane thin films prepared on planar surfaces [74,75,138]. 

Loiacono MJ, Granstrom EL, Frisbie CD (1998) Investigation of charge transport in thin, doped sexithiophene crystals by conducting probe atomic force microscopy. J Phys Chem B 102 1679-1688... 

In addition to the electrochemical techniques, many surface analytical techniques are constantly in use, such as ellipsome-try for the surface thin oxide thickness, multiple reflection infrared spectroscopy (MIR), and X-ray photoelectron spectroscopy (XPS) for surface layer composition, total reflection X-ray fluorescence spectroscopy (TXRFS) for the metal surface contaminants, and naturally atomic force microscopy (AFM) for the surface roughness profile. 

The effect on structure of confining block copolymers in thin films has been examined, largely using neutron reflectivity and atomic force microscopy. A number of features that result from the constraint of reduced dimensionality have been reported, such as the observation of islands and holes at the surface... 

Fig. 2.58 Terracing in a thin him of a symmetric PS-PMMA diblock observed using atomic force microscopy (M = 57 kg mol-1) (Ausserre et al. 1993).

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